Search Results1-20 of  24

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  • Nishiyama Hidetoshi ID: 9000008743237

    Articles in CiNii:1

    • Effects of Prolactin on The Levels of Urinary Components and Blood Glucose in SHN Mice before and after Spontaneous Mammary Tumour Appearance （1993）
  • NISHIYAMA Hidetoshi ID: 9000246805596

    Articles in CiNii:1

    • Nanometer-scale Real-space Observation and Material Processing for Polymer Materials under Atmospheric Pressure : Application of Atmospheric Scanning Electron Microscopy （2014）
  • NISHIYAMA Hidetoshi ID: 9000002961912

    (株)日立製作所生産技術研究所 （2002 from CiNii）

    Articles in CiNii:2

    • A Proposal of Sensitivity Optimization Method for Dark-field Particle Inspection Technique in Semiconductor Manufacturing （2002）
    • Evaluation of Inspection Process Strategies through VLSI Wafer-Process Simulation Analysis （2002）
  • NISHIYAMA Hidetoshi ID: 9000003715645

    ソニー(株) （1998 from CiNii）

    Articles in CiNii:1

    • Estimation of Elastic Interaction Effects between Macrocrack-Microcrack Array by Homogenization Method （1998）
  • NISHIYAMA Hidetoshi ID: 9000004890117

    Image Recognition and Inspection System Department, Production Engineering Research Laboratory, Hitachi Ltd. （2002 from CiNii）

    Articles in CiNii:1

    • Evaluation of Inspection Process Strategies through VLSI Wafer-Process Simulation Analysis （2002）
  • NISHIYAMA Hidetoshi ID: 9000005763887

    Central Research Laboratory, Hitachi, Ltd. （1999 from CiNii）

    Articles in CiNii:1

    • Monochromatic Election Emitters using Heavy-Fermion Materials （1999）
  • NISHIYAMA Hidetoshi ID: 9000006726659

    (株)グラック （2006 from CiNii）

    Articles in CiNii:2

    • Technology & Ideal Way of Organization for New Park Administrator （2006）
    • 指定管理者制度と造園技術の今後の展開について （2006）
  • NISHIYAMA Hidetoshi ID: 9000014546069

    Wireless Communication Systems Division, Hitachi Kokusai Electric Inc. （2008 from CiNii）

    Articles in CiNii:4

    • Remote Site Failover in Next Generation Private Network System （2008）
    • A Scheme for Press-Talk in Next Generation Private Network System （2008）
    • Remote Site Failover in Next Generation Private Network System （2008）
  • NISHIYAMA Hidetoshi ID: 9000018755168

    日本電子(株)開発本部 （2013 from CiNii）

    Articles in CiNii:6

    • ハイスループットで細胞を観察する走査電子顕微鏡 （2009）
    • Atmospheric Scanning Electron Microscopy (ASEM) of Dynamic Phenomena of Materials in Liquid （2011）
    • Immuno-EM in solution using the Atmospheric Scanning Electron Microscope (ASEM) （2013）
  • NISHIYAMA Hidetoshi ID: 9000107320840

    Central Research Laboratory, Hitachi Ltd. （2003 from CiNii）

    Articles in CiNii:1

    • Study of Energy Distribution of Schottky Emitted Electrons and its Theoretical Analysis using Effective Mass Approximation （2003）
  • NISHIYAMA Hidetoshi ID: 9000253328095

    Central Research Laboratory, Hitachi Ltd （2002 from CiNii）

    Articles in CiNii:1

    • Electron emission with a narrow energy width from Schottky emitters （2002）
  • NISHIYAMA Hidetoshi ID: 9000254520597

    GLAC CO., LTD （2007 from CiNii）

    Articles in CiNii:1

    • Study of user oriented effective management level of turf grass （2007）
  • NISHIYAMA Hidetoshi ID: 9000258283770

    JEOL Ltd. （2014 from CiNii）

    Articles in CiNii:1

    • Nanometer-scale Real-space Observation and Material Processing for Polymer Materials under Atmospheric Pressure: Application of Atmospheric Scanning Electron Microscopy （2014）
  • NISHIYAMA Hidetoshi ID: 9000303998405

    Advanced Technology Division, JEOL Ltd. （2015 from CiNii）

    Articles in CiNii:1

    • Development of an in-solution observation method using atmospheric scanning electron microscopy (ASEM):— Interdisciplinary research between semiconductor fabrication technology and biological electron microscopy — （2015）
  • NISHIYAMA Hidetoshi ID: 9000318139498

    Advanced Technology Division, JEOL Ltd. （2015 from CiNii）

    Articles in CiNii:1

    • Development of an in-solution observation method using atmospheric scanning electron microscopy (ASEM):— Interdisciplinary research between semiconductor fabrication technology and biological electron microscopy — （2015）
  • Nishiyama Hidetoshi ID: 9000017711801

    Advanced Technology Division, JEOL Ltd （2012 from CiNii）

    Articles in CiNii:7

    • Direct electron microscopy of Mycoplasma in solution using the atmospheric SEM （2012）
    • 2TP5-01 Structure analysis of membrane protein complexes using TEM and SEM(The 47th Annual Meeting of the Biophysical Society of Japan) （2009）
    • 2P-018 Structure analysis of membrane protein complexes using TEM and SEM(Protein:Structure,The 47th Annual Meeting of the Biophysical Society of Japan) （2009）
  • Nishiyama Hidetoshi ID: 9000238280692

    JEOL （2012 from CiNii）

    Articles in CiNii:1

    • 3E1022 Direct electron microscopy of protein crystals and Mvconlasma cells in solution using the Atmosnheric SEM(Proteins:Structure,Oral Presentation,The 50th Annual Meeting of the Biophysical Society of Japan) （2012）
  • Nishiyama Hidetoshi ID: 9000259306634

    JEOL （2013 from CiNii）

    Articles in CiNii:1

    • 3P007 Direct electron microscopy of protein crystals and Mycoplasma cells in solution using the Atmospheric SEM(01A. Protein: Structure,Poster) （2013）
  • Nishiyama Hidetoshi ID: 9000401683557

    Articles in CiNii:1

    • Monochromatic Electron Emitters using Heavy-Fermion Materials （1999）
  • Nishiyama Hidetoshi ID: 9000401719964

    Articles in CiNii:1

    • Study of Energy Distribution of Schottky Emitted Electrons and its Theoretical Analysis using Effective Mass Approximation （2003）
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