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  • OBORI Kenichi ID: 9000003631130

    HORIBA, Ltd. Semiconductor/Scientific Instruments & Systems Division (2005 from CiNii)

    Articles in CiNii:8

    • International Standardization of EPMA, AEM, SEM Analysis and Measurements (2003)
    • Miniaturization of X-ray source and X-ray guide tube (2005)
    • Direction of International Standardization on the Microbeam Analysis (ISO/TC202) (2005)
  • OBORI Kenichi ID: 9000005726853

    Horiba Ltd. (2002 from CiNii)

    Articles in CiNii:3

    • Continuum X-Ray Generation from W Film on Cu Substrate (2000)
    • Monte Carlo Simulation of Generations of Continuous and Characteristic X - Rays by Electron Impact (2000)
    • Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (2002)
  • OBORI kenichi ID: 9000021655765

    Articles in CiNii:1

    • Direction of International Standardization on the Microbeam Analysis (ISO/TC202) (2005)
  • Obori Kenichi ID: 9000401687654

    Articles in CiNii:1

    • Continuum X-Ray Generation from W Film on Cu Substrate (2000)
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