Search Results1-12 of  12

  • Ogata Tomohiko ID: 9000025036800

    Articles in CiNii:1

    • New method to obtain (001) surface-oriented polycrystalline silicon films by intensity-modulated excimer laser annealing: molecular dynamics study (Special issue: Active-matrix flatpanel displays and devices: TFT technologies and FPD materials) （2009）
  • OGATA Tomohiko ID: 9000000012871

    Toray Co., Ltd. （1995 from CiNii）

    Articles in CiNii:1

    • R-curve Behavior of Al_2O_3/ZrO_2 Composites Measured by Stable Fracture Test in Bending （1995）
  • OGATA Tomohiko ID: 9000003638386

    Ceramics Division, Toray Industries Inc. （2005 from CiNii）

    Articles in CiNii:2

    • A Spodumene Silicon Nitride Complex with Zero Thermal Expansion at Ambient Temperature （2003）
    • Recycle of Y-TZP Ceramics （2005）
  • OGATA Tomohiko ID: 9000018604019

    Department of Materials Science and Engineering, Faculty of Engineering, Kyushu University （2010 from CiNii）

    Articles in CiNii:1

    • Excimer Laser Crystallization Processes of Amorphous Silicon Thin Films by Using Molecular-dynamics Simulations （2010）
  • OGATA Tomohiko ID: 9000020086442

    Articles in CiNii:1

    • Fracture Behavior of Y<sub>2</sub>O<sub>3</sub> Doped Tetragonal Zirconia Polycrystals （1988）
  • OGATA Tomohiko ID: 9000020253329

    Articles in CiNii:1

    • Effects of Al<sub>2</sub>O<sub>3</sub> Addition on Mechanical Properties and Microstructures of Y-TZP （1988）
  • OGATA Tomohiko ID: 9000020278859

    Articles in CiNii:1

    • Fabrication of Zirconium Nitride Sintered Bodies and the Application for Electrode Materials （1989）
  • OGATA Tomohiko ID: 9000020622674

    Articles in CiNii:1

    • Thermal Expansion Behavior of TiB<sub>2</sub>/ZrC Composite Prepared by Substitutional Reaction Sintering Method （1994）
  • OGATA Tomohiko ID: 9000258461194

    Toray Industries, Inc. Shiga Plant （2004 from CiNii）

    Articles in CiNii:1

    • Microstructural Characterization of Spodumene-Silicon Nitride Complex by Transmission Electron Microscopy （2004）
  • OGATA Tomohiko ID: 9000391839910

    Toray Industries, Inc., JAPAN （2003 from CiNii）

    Articles in CiNii:1

    • Mirostructural Characterization of Spodumene Silicon Nitride Complex by Transmission Electron Microscopy （2003）
  • Ogata Tomohiko ID: 9000391847462

    Toray Industries, Inc. （2003 from CiNii）

    Articles in CiNii:1

    • Microstructure and property of Si3N4 doped β-spodumene （2003）
  • Ogata Tomohiko ID: 9000401777697

    Articles in CiNii:1

    • New Method to Obtain (001) Surface-Oriented Polycrystalline Silicon Films by Intensity-Modulated Excimer Laser Annealing: Molecular Dynamics Study （2009）
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