Search Results41-60 of  78

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  • OGAWA Soichi ID: 9000259318985

    Ogawa Creation Research Laboratory (2013 from CiNii)

    Articles in CiNii:1

    • Optical Properties of the Sputter-Deposited AlN/Al/AlN Multilayer Nanofilms (2013)
  • OGAWA Soichi ID: 9000261666962

    Ogawa Creation Research Laboratory (2013 from CiNii)

    Articles in CiNii:1

    • Low Resistivity Transparent Conductive Film of the Metal Alloy/Dielectric Nano-Multilayer by Sputtering (2013)
  • OGAWA Soichi ID: 9000360584520

    Ogawa Creation Research Laboratory (2017 from CiNii)

    Articles in CiNii:1

    • Measurement of Steady State Pressure Distribution and Dynamic Pressure Fluctuations During Sputtering Process (2017)
  • Ogawa Soichi ID: 9000021591343

    大阪府立産業技術総合研究所 (1991 from CiNii)

    Articles in CiNii:1

    • A deposition of Cu-O thin films by low energy oxygen ion assisted evaporarion method. (1991)
  • Ogawa Soichi ID: 9000242374514

    LSIJAPAN CO.,LTD. (2012 from CiNii)

    Articles in CiNii:1

    • 5-2 The research and development of the closed captioning production and Receiving system and unit applied to the digital broadcasting, Enabling to display real-time captions appeared in the appropriate timing (2012)
  • Ogawa Soichi ID: 9000252761866

    Osaka Prefectural Industrial Technology Research Institute (1989 from CiNii)

    Articles in CiNii:1

    • Fabrication of Bi(Pb)SrCaCuO Thin Film of High-<I>T</I><SUB>c</SUB> Phase (1989)
  • Ogawa Soichi ID: 9000252766956

    Articles in CiNii:1

    • Synthesis of Zr–N Thin Film by Reactive Ion Beam Sputtering (1993)
  • Ogawa Soichi ID: 9000252767390

    Osaka Prefectural Industrial Technology Research Institute (1993 from CiNii)

    Articles in CiNii:1

    • Effects of Ion Species on Reactive-Ion-Beam-Sputtered Zr–N Films (1993)
  • Ogawa Soichi ID: 9000252968460

    Osaka Prefectural Industrial Technology Research Institute (1989 from CiNii)

    Articles in CiNii:1

    • The Contact Resistance of the YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7−δ</SUB>-Metal Film System (1989)
  • Ogawa Soichi ID: 9000252968601

    Osaka Prefecture Industrial Technology Research Institute (1989 from CiNii)

    Articles in CiNii:1

    • PIXE in Determination of Argon Impurity in Ion Beam Sputter-Deposited Co–Cr Films (1989)
  • Ogawa Soichi ID: 9000252968755

    Osaka Prefectural Industrial Research Institute (1989 from CiNii)

    Articles in CiNii:1

    • High-Energy Ion Beam Analysis of YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> Thin Films (1989)
  • Ogawa Soichi ID: 9000252972515

    Industrial Technology Research Institute, Osaka Prefecture (1990 from CiNii)

    Articles in CiNii:1

    • Synthesis of Zr–N Thin Film by Reactive Ion Beam Sputtering (1990)
  • Ogawa Soichi ID: 9000252980716

    Osaka Prefectural Industrial Technology Research Institute (1992 from CiNii)

    Articles in CiNii:1

    • Effects of Nitrogen Pressure and RF Power on the Properties of Reactive Magnetron Sputtered Zr–N Films and an Application to a Thermistor (1992)
  • Ogawa Soichi ID: 9000254121710

    Department of Physics, Faculty of Science, Osaka-City University (1966 from CiNii)

    Articles in CiNii:1

    • Magnetic Properties of Superconducting Sn Films (1966)
  • Ogawa Soichi ID: 9000283846865

    Ogawa Creation Research Laboratory (2010 from CiNii)

    Articles in CiNii:1

    • Nitride thin films prepared by reactive sputtering method using N-MHV sputtering system. (2010)
  • Ogawa Soichi ID: 9000283846871

    Ogawa Creation Research Laboratory (2010 from CiNii)

    Articles in CiNii:1

    • Experimental Fabrication of Tension Control System for Roll-to-roll Sputtering System Using Highly Efficient Micro-sized Force Sensor (2010)
  • Ogawa Soichi ID: 9000345209279

    Ogawa Creation Research Laboratory (2016 from CiNii)

    Articles in CiNii:1

    • Thermal conductivity hydrogen gas sensor with TaAl-N thin films (2016)
  • Ogawa Soichi ID: 9000345209285

    Ogawa Creation Research Laboratory (2016 from CiNii)

    Articles in CiNii:1

    • Pressure measurements with micro thin film sensor during sputtering process(2) (2016)
  • Ogawa Soichi ID: 9000347215571

    Ogawa Creation Research Laboratory (2015 from CiNii)

    Articles in CiNii:1

    • Pressure measurements of roll-to-roll sputtering system with micro thin film sensor (2015)
  • Ogawa Soichi ID: 9000363181436

    Ogawa Creation Research Laboratory (2017 from CiNii)

    Articles in CiNii:1

    • Deposition of TaAl-N Thin Film with Ta-Al Composite Target by Reactive Sputtering(2) (2017)
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