Search Results1-10 of  10

  • OHNISHI Ken-ichi ID: 9000006917577

    Faculty of Engineering, Yokohama National University (2008 from CiNii)

    Articles in CiNii:1

    • Intermodulation caused by Surface Mount-Device and Defected Connection (2008)
  • OHNISHI Ken-ichi ID: 9000254279550

    Omron Tateisi Electronics Co. (1982 from CiNii)

    Articles in CiNii:1

    • The Detection of Characteristic Impedance Unbalanced Point in Co-Axial Cable (1982)
  • OHNISHI Ken-ichi ID: 9000003292798

    Faculty of Engineering Science,Osaka University (1980 from CiNii)

    Articles in CiNii:3

    • Bound Multiexciton Luminescence in Boron-Doped Silicon: Excitation-Level Dependence and Recombination Kinetics (1979)
    • Bound Multiexciton Luminescence in Lithium-Doped Silicon (1980)
    • Charge-Changing Collisions of 0.7-2.0 MeV Helium Beams in Various Gases-2-Electron Loss (1980)
  • OHNISHI Ken-ichi ID: 9000005946992

    Articles in CiNii:4

    • Relationship between balcony configuration and directional characteristics of early reflections in auditoria (1997)
    • RELATIONSHIP BETWEEN THE BALCONY CONFIGURATION AND ACOUSTICAL CHARACTERISTICS OF EARLY REFLECTIONS IN AUDITORIA (1997)
    • 411 オーディトリウムのバルコニー形態と初期反射音の方向特性 : 客席床に傾斜がある場合(環境工学) (1997)
  • Ohnishi Ken-ichi ID: 9000254131670

    Faculty of Engineering Science, Osaka University (1980 from CiNii)

    Articles in CiNii:1

    • Bound Multiexciton Luminescence in Lithium-Doped Silicon (1980)
  • Ohnishi Ken-ichi ID: 9000254553981

    Faculty of Engineering Science, Osaka University (1979 from CiNii)

    Articles in CiNii:1

    • Bound Multiexciton Luminescence in Boron-Doped Silicon: Excitation-Level Dependence and Recombination Kinetics (1979)
  • Ohnishi Ken-ichi ID: 9000283739588

    Yokohama Nat'l Univ. (2007 from CiNii)

    Articles in CiNii:1

    • Non-destractive detection of electrical connection failure by using passive intermodulation (2007)
  • Ohnishi Ken-ichi ID: 9000401842289

    Faculty of Engineering Science, Osaka University (1979 from CiNii)

    Articles in CiNii:1

    • Bound Multiexciton Luminescence in Boron-Doped Silicon: Excitation-Level Dependence and Recombination Kinetics (1979)
  • Ohnishi Ken-ichi ID: 9000401844395

    Faculty of Engineering Science, Osaka University (1980 from CiNii)

    Articles in CiNii:1

    • Bound Multiexciton Luminescence in Lithium-Doped Silicon (1980)
  • Ohnishi Ken-ichi ID: 9000006661956

    Faculty of Engineering, Yokohama National University (2009 from CiNii)

    Articles in CiNii:4

    • C-5-2 Non-Contact Localization of a PIM Source using a Small-Loop Probe (2007)
    • C-5-9 The basic study of detection of defected connection including the package inside using PIM (2008)
    • C-5-3 The Effect of a Loop Probe in Defected Chip Device Detection (2009)
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