Search Results1-20 of  34

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  • OHWAKI Takeshi ID: 9000000115513

    KOBE STEEL, LTD. (1999 from CiNii)

    Articles in CiNii:3

    • The effect of annealing on high purity aluminum after A. C. etching (1996)
    • The effect of alkaline pretreatment on the pitting sites of aluminum foil for high voltage electrolytic capacitor. (1999)
    • 極薄ゲ-ト酸化膜の信頼性に及ぼす自然酸化膜の影響 (電子材料特集) (1998)
  • OHWAKI Takeshi ID: 9000001119918

    Chemical & Environmental Technology Laboratory, Technical Development Group, Kobe Steel, Ltd. (2004 from CiNii)

    Articles in CiNii:1

    • Characterization of native oxide on aluminum by infrared spectroscopy (2004)
  • OHWAKI Takeshi ID: 9000002171907

    Toyota Central Research and Development Laboratories, Inc. (2006 from CiNii)

    Articles in CiNii:1

    • Deep-Level Characterization of Tris(8-Hydroxyquinoline) Aluminum with and without Quinacridone Doping (2006)
  • OHWAKI Takeshi ID: 9000003513407

    Articles in CiNii:18

    • Effect of Water Absorption of Dietectric Underlayers on Texture and Reliability in Al-Si-Cu/Ti/TiN/Ti Layered Interconnects (1998)
    • Hydrophobic Surface Treatment of Metal Oxides (1996)
    • Wettability and Friction Coefficient of the Oxide Thin Film Surface (1998)
  • OHWAKI Takeshi ID: 9000005585090

    Toyota Central R & D Laboratories Inc. (2006 from CiNii)

    Articles in CiNii:8

    • Photocatalytic Degradation of Formaldehyde and Toluene Mixtures in Air with a Nitrogen-doped TiO_2 Photocatalyst (2006)
    • Characterization of Silicon Native Oxide Formed in SC-1, H_2O_2 and Wet Ozone Processes (1997)
    • Influence of Native Oxides On the Reliability of Ultrathin Gate Oxide (1998)
  • OHWAKI Takeshi ID: 9000005647520

    Technical Development Group, Kobe Steel, Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • Infrared Absorption at Longitudinal Optical Frequency in Amorphous Oxides and Their Mixtures (1999)
  • OHWAKI Takeshi ID: 9000005677162

    Toyota Central R & D Laboratories Inc. (1997 from CiNii)

    Articles in CiNii:1

    • Preferred Orientation in Ti Films Sputter-Deposited on SiO_2 Glass:The Role of Water Chemisorption on the Substrate (1997)
  • OHWAKI Takeshi ID: 9000020158569

    Toyota Central Research and Development Laboratories (1987 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1987)
  • OHWAKI Takeshi ID: 9000257968920

    Chemical & Environmental Technology Laboratory, Technical Development Group, Kobe Steel, Ltd. (2004 from CiNii)

    Articles in CiNii:1

    • Characterization of native oxide on aluminum by infrared spectroscopy (2004)
  • OHWAKI Takeshi ID: 9000257983205

    TOYOTA Central R & D Labs., Inc. (2007 from CiNii)

    Articles in CiNii:1

    • Photochemical Reaction of VOC Gases on the Visible Light Photocatalyst Surfaces (2007)
  • OHWAKI Takeshi ID: 9000258461209

    Toyota Central R & D Labs., Inc. (2004 from CiNii)

    Articles in CiNii:1

    • Photocatalytic Activity of Sulfur-Doped TiO<sub>2</sub> Prepared via Thio Sol-Gel Process (2004)
  • OHWAKI Takeshi ID: 9000391839569

    Toyota Central R&D Labs., Inc., JAPAN (2003 from CiNii)

    Articles in CiNii:1

    • Photocatalytic Activity of Sulfur-Doped TiO<SUB>2</SUB> Prepared via Thio Sol-Gel Process (2003)
  • Ohwaki Takeshi ID: 9000071186740

    Articles in CiNii:1

    • Deep-Level Characterization of Tris(8-hydroxyquinoline) Aluminum with and without Quinacridone Doping (2007)
  • Ohwaki Takeshi ID: 9000252775485

    Toyota Central Research & Development Laboratories, Inc. (1985 from CiNii)

    Articles in CiNii:1

    • Strength and Interfacial Reaction of High Modulus Carbon Fiber-Reinforced Aluminum Alloys (1985)
  • Ohwaki Takeshi ID: 9000252954189

    Toyota Central Research and Development Laboratories Inc. (1984 from CiNii)

    Articles in CiNii:1

    • Secondary Ion Emission from Si Subjected to Oxygen Ion Bombardment (1984)
  • Ohwaki Takeshi ID: 9000257725428

    Toyota Central R & D Laboratories Inc. (2006 from CiNii)

    Articles in CiNii:1

    • Photocatalytic Degradation of Formaldehyde and Toluene Mixtures in Air with a Nitrogen-doped TiO2 Photocatalyst (2006)
  • Ohwaki Takeshi ID: 9000258134559

    Toyota Central Research and Development Laboratories, Inc., 41–1 Yokomichi, Nagakute–cho, Aichi–gun, Aichi 480–11, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Interfacial Stability Between Ta-Sn-O Films and Indium Tin Oxide Electrodes. (1997)
  • Ohwaki Takeshi ID: 9000258135473

    Toyota Central R & D Laboratories Inc., Nagakute, Aichi 480–11, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Preferred Orientation in Ti Films Sputter-Deposited on SiO2 Glass: The Role of Water Chemisorption on the Substrate. (1997)
  • Ohwaki Takeshi ID: 9000258139937

    Technical Development Group, Kobe Steel Ltd., Takatsukadai, Nishi–ku, Kobe 651–22, Japan (1998 from CiNii)

    Articles in CiNii:1

    • Influence of Native Oxides on the Reliability of Ultrathin Gate Oxide. (1998)
  • Ohwaki Takeshi ID: 9000258143561

    Technical Development Group, Kobe Steel, Ltd., Takatsukadai, Kobe 651–2271, Japan (1999 from CiNii)

    Articles in CiNii:1

    • Infrared Absorption at Longitudinal Optical Frequency in Amorphous Oxides and Their Mixtures. (1999)
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