Search Results1-20 of  22

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  • OIKAWA HIDEO ID: 9000021121455

    Articles in CiNii:1

    • Studies on the digestion in the rabbit:On the manganese content of the blood in the rabbit (1952)
  • OIKAWA HIDEO ID: 9000021122734

    Morioka College of Agr. and Forest., Iwate Univ (1957 from CiNii)

    Articles in CiNii:1

    • Studies on the digestion in the rabbit:VIII(No.2)Digestibility of the wild white clover in the growing rabbit (1957)
  • OIKAWA HIDEO ID: 9000021126408

    Iwite Univ. (1953 from CiNii)

    Articles in CiNii:1

    • Studies on tne digestion in the rabbit:III The influence of oral administration of manganese oxide on the manganese content of rabbit's blood (1953)
  • OIKAWA Hideo ID: 9000002961337

    NTTアフティ(株) (2000 from CiNii)

    Articles in CiNii:3

    • Mo蒸着膜の性質 (1978)
    • モリブデン電極配線技術 (1975)
    • Deposition of High Quality Thin Films Using ECR Plasma (2000)
  • OIKAWA Hideo ID: 9000005523268

    Department of Physics, Gakushuin University (1971 from CiNii)

    Articles in CiNii:1

    • Decrement of Piezoelectric Constants Caused by Screening Effect of Conduction Electrons on the Effective Charge of CdS Crystals (1971)
  • OIKAWA Hideo ID: 9000005528608

    Musashino Electrical Communication Laboratory (1975 from CiNii)

    Articles in CiNii:1

    • Ellipsometric Investigation of Corrosion of Deposited Thin Molybdenum Film (1975)
  • OIKAWA Hideo ID: 9000005623901

    NTT LSI Laboratories 3-1 (1989 from CiNii)

    Articles in CiNii:1

    • New Taper-Etching Technology Using Oxygen Ion Plasma : Etching and Deposition Technology : (1989)
  • OIKAWA Hideo ID: 9000005752126

    Musashino Electrical Communication Laboratory Nippon Telegr (1979 from CiNii)

    Articles in CiNii:1

    • (Invited) Mo-gate MOS Metallization System : A-4: DEVICE TECHNOLOGY (1) (1979)
  • OIKAWA Hideo ID: 9000253321225

    Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation (1978 from CiNii)

    Articles in CiNii:1

    • Physical Properties of Vacuum Deposited Mo Films (1978)
  • OIKAWA Hideo ID: 9000254389125

    Iwate Sericultural Experiment Station (1965 from CiNii)

    Articles in CiNii:1

    • The relationship between the damage of violet root rot in mulberry fields and the results of inspection of the causal fungus in soil at the forests near the fields (1965)
  • OIKAWA Hideo ID: 9000254600230

    Articles in CiNii:1

    • Sporulation of <i>Stigmina mori</i> on Culture Media (1982)
  • OIKAWA Hideo ID: 9000256574125

    (社) 岩手県植物防疫協会 (1993 from CiNii)

    Articles in CiNii:1

    • Insect and Pest Damages on Apple Fruit and Tree by Pesticide-free Cultivation (1993)
  • Oikawa Hideo ID: 9000252755957

    Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation (1975 from CiNii)

    Articles in CiNii:1

    • Ellipsometric Investigation of Corrosion of Deposited Thin Molybdenum Film (1975)
  • Oikawa Hideo ID: 9000252938390

    Department of Physics, Gakushuin University (1971 from CiNii)

    Articles in CiNii:1

    • Decrement of Piezoelectric Constants Caused by Screening Effect of Conduction Electrons on the Effective Charge of CdS Crystals (1971)
  • Oikawa Hideo ID: 9000252954991

    Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation (1984 from CiNii)

    Articles in CiNii:1

    • Stability of Mo Gate MOS Devices Using High Purity Sputtering Target (1984)
  • Oikawa Hideo ID: 9000255900058

    NTT LSI Lab., Nippon Telegraph and Telephone Corp. (1989 from CiNii)

    Articles in CiNii:1

    • Refractory metal. (1989)
  • Oikawa Hideo ID: 9000258552451

    Department of Pediatric Dentistry, Nihon University School of Dentistry at Matsudo (2003 from CiNii)

    Articles in CiNii:1

    • Study of the Relationship between Genetic Factors in Sizes of Crowns of the First Molars and Jaws in Inbred Mice (2003)
  • Oikawa Hideo ID: 9000392691445

    Articles in CiNii:1

    • Stability of Mo Gate MOS Devices Using High Purity Sputtering Target (1984)
  • Oikawa Hideo ID: 9000401575549

    Articles in CiNii:1

    • Decrement of Piezoelectric Constants Caused by Screening Effect of Conduction Electrons on the Effective Charge of CdS Crystals (1971)
  • Oikawa Hideo ID: 9000401580002

    Articles in CiNii:1

    • Ellipsometric Investigation of Corrosion of Deposited Thin Molybdenum Film (1975)
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