Search Results1-6 of  6

  • LUI Basil On-Kit ID: 9000004754947

    Epson Cambridge Laboratory (2001 from CiNii)

    Articles in CiNii:1

    • Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary for Polycrystalline Silicon Thin-Film Transistors (2001)
  • LUI Basil On-Kit ID: 9000107350367

    Epson Cambrodge Laboratory (2001 from CiNii)

    Articles in CiNii:1

    • Extraction of Trap State at the Oxide-Silicon Interface and Grain Biundary in Polycrystallune Silicon Thin-Film Transistors (2001)
  • Lui Basil On-Kit ID: 9000258154129

    Epson Cambridge Laboratory, 8c King's Parade, Cambridge CB2 1SJ, United Kingdom (2001 from CiNii)

    Articles in CiNii:1

    • Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary in Polycrystalline Silicon Thin-Film Transistors. (2001)
  • Lui Basil On-Kit ID: 9000401696211

    Articles in CiNii:1

    • Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary in Polycrystalline Silicon Thin-Film Transistors (2001)
  • Lui Basil On-Kit ID: 9000401700357

    Articles in CiNii:1

    • Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary for Polycrystalline Silicon Thin-Film Transistors (2001)
  • ON-KIT LUI Basil ID: 9000004754946

    Articles in CiNii:1

    • Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary for Polycrystalline Silicon Thin-Film Transistors (2002)
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