Search Results1-17 of  17

  • Ono Mizuki ID: 9000025017271

    Articles in CiNii:1

    • Comprehensive study of electron mobility and band gap in tensile-strained bulk Ge (Special issue: Solid state devices and materials) (2010)
  • Mizuki ONO ID: 9000351464957

    Articles in CiNii:1

    • Nonperturbative Treatment of Open Strings in Less Than 1-Dimension (1991)
  • ONO MIZUKI ID: 9000399242121

    Chofukosan co.,ltd (2018 from CiNii)

    Articles in CiNii:1

    • Drying promotion system of the sluge by using soler heat (2018)
  • ONO MIZUKI ID: 9000399242432

    Chofukosan co.,ltd (2018 from CiNii)

    Articles in CiNii:1

    • Drying promotion system of the sludge by using soler heat. (2018)
  • ONO Mizuki ID: 9000002166148

    Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Dependences of Device Performances on Interfacial Layer Materials of High-k MISFETs due to Wave Function Penetration into Gate Dielectrics (2004)
  • ONO Mizuki ID: 9000002171147

    Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation (2006 from CiNii)

    Articles in CiNii:2

    • Degradation of Current Drivability of Schottky Source/Drain Transistors with High-k Gate Dielectrics and Possible Measures to Suppress the Phenomenon (2005)
    • Improved Performance of Schottky Barrier Source/Drain Transistors with High-K Gate Dielectrics by Adopting Recessed Channel and/or Buried Source/Drain Structures (2006)
  • ONO Mizuki ID: 9000004969877

    ULSI Research Laboratories, R&D Center, TOSHIBA CORPORATION (1996 from CiNii)

    Articles in CiNii:2

    • Dependence of Various Electrical Characteristics on Channel Impurity Concentration in 0.1μm CMOSFETs (1994)
    • Study on the Realization of High Performance MOSFETs with Gate lenths 0.1μm and Below (1996)
  • ONO Mizuki ID: 9000004970863

    Advanced LSI Research Laboratory, Corporate R&D Center, Toshiba Corporation (2005 from CiNii)

    Articles in CiNii:2

    • HfSiON : Its superb characteristics as a thermally stable gate dielectric and the remaining issue for its application to real LSIs (2005)
    • HfSiON Its superb characteristics as a thermally stable gate dielectric and the remaining issue for its application to real LSIs (2005)
  • ONO Mizuki ID: 9000005544846

    Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation (2002 from CiNii)

    Articles in CiNii:3

    • Elevated Extension Structure for 35nm MOSFETs (2001)
    • Premastered Optical Disk by Superresolution Using Rear Aperture Detection (1996)
    • Elevated Extension Structure for 35nm MOSFETs (2002)
  • ONO Mizuki ID: 9000402253644

    Laboratory of Animal Health, Department of Veterinary Medicine, Faculty of Agriculture, Tokyo University of Agriculture and Technology, 3-5-8, Saiwai-cho, Fchu-shi, Tokyo 183-8509, Japan (2019 from CiNii)

    Articles in CiNii:1

    • Inhibitory effect of grapefruit seed extract (GSE) on avian pathogens (2019)
  • Ono Mizuki ID: 9000025064240

    Articles in CiNii:1

    • Advantages of densely packed multi-wire transistors with planar gate structure fabricated on low-k buried insulator over planar silicon-on-insulator devices (2009)
  • Ono Mizuki ID: 9000283571859

    Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation (2003 from CiNii)

    Articles in CiNii:1

    • Characterization of high-k materials for the advancement of high-speed ULSIs (2003)
  • Ono Mizuki ID: 9000401705959

    Articles in CiNii:1

    • Elevated Extension Structure for 35 nm MOSFETs (2002)
  • Ono Mizuki ID: 9000401786606

    Articles in CiNii:1

    • Comprehensive Study of Electron Mobility and Band Gap in Tensile-Strained Bulk Ge (2010)
  • Ono Mizuki ID: 9000401940278

    Articles in CiNii:1

    • Nonperturbative Treatment of Open Strings in Less Than 1-Dimension (1991)
  • Ono Mizuki ID: 9000402238373

    Articles in CiNii:1

    • Pure deep-ultraviolet cathodoluminescence from rocksalt-structured MgZnO grown with carbon-free precursors (2019)
  • Ono Mizuki ID: 9000403557215

    Articles in CiNii:1

    • 8-oxoguanine causes spontaneous de novo germline mutations in mice. (2014)
Page Top