Search Results1-3 of  3

  • OSAWA Tokuya ID: 9000004929906

    System LSI Laboratory, Mitsubishi Electric Corporation (1997 from CiNii)

    Articles in CiNii:1

    • A Proposal of RAM Test Pattern for Pseudo Random Addressing (1997)
  • OSAWA Tokuya ID: 9000014064236

    Division of Dermatology, Department of Medicine of Sensory and Motor Organs, Faculty of Medicine, Tottori University (2005 from CiNii)

    Articles in CiNii:1

    • Pilomatricoma in children : clinicopathological and statistical study in Tottori University (2005)
  • OSAWA Tokuya ID: 9000017684095

    Renesas Technology (2009 from CiNii)

    Articles in CiNii:1

    • A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test (2009)
Page Top