Search Results1-20 of  42

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  • OTANI Yukitoshi ID: 1000010233165

    Articles in CiNii:221

    • LD直交2周波光源を用いた共通光路干渉計による表面形状計測 (1995)
    • 位相シフトモアレ法による液晶基板のフラットネス測定法 (1995)
    • 局所サンプリング位相シフト法による高感度表面形状測定 (1995)
  • OTANI Yukitoshi ID: 9000001699156

    Deptartment of Mechanical Systems Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology (1994 from CiNii)

    Articles in CiNii:1

    • The Local-Sampling Phase Shifting Technique for Precise Two-Dimensional Birefringence Measurement (1994)
  • OTANI Yukitoshi ID: 9000020797512

    Articles in CiNii:1

    • Profile Measurement of Rough Surface using the Phase-shifting Abramson Interferometry. (1994)
  • Otani Yukitoshi ID: 9000020658743

    Articles in CiNii:1

    • Magnetic Field Sensing using Magnetic Fluids. (1993)
  • Otani Yukitoshi ID: 9000020796359

    Articles in CiNii:1

    • Moire topography with sensitivity of sub-micrometer. (1989)
  • Otani Yukitoshi ID: 9000345226525

    Articles in CiNii:6

    • Spectroscopic Mueller matrix microscope and its application to bio-imaging (2014)
    • 3D profilometry by polarization pattern projection (2015)
    • Optical Studies for Polymer Processing Engineer(Chapter 2)Measurement Theory and Method of Light Properties(2.8)Optical Interferometry (2016)
  • Otani Yukitoshi ID: 9000345226937

    Utsunomiya University (2016 from CiNii)

    Articles in CiNii:1

    • Nano structure measurement using decomposition analysis by spectroscopic Mueller polarimetry (2016)
  • Otani Yukitoshi ID: 9000345276250

    Utsunomiya university (2016 from CiNii)

    Articles in CiNii:1

    • 3D surface measurement using uni-axis image fiber system (2016)
  • Otani Yukitoshi ID: 9000345276257

    Utsunomiya University (2016 from CiNii)

    Articles in CiNii:1

    • Phase sensitive CT measurement using a pixelated polarizing shearing interferometer (2016)
  • Otani Yukitoshi ID: 9000345276573

    Utsunomiya university (2016 from CiNii)

    Articles in CiNii:1

    • 偏光パターン投影による同軸三次元形状計測-第3報 (2016)
  • Otani Yukitoshi ID: 9000347152775

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • 偏光パターン投影による同軸三次元形状計測 (2014)
  • Otani Yukitoshi ID: 9000347153656

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • Single nano particle imaging method by photothermal effect (5th report):Heat transfer analysis around single nanoparticle (2014)
  • Otani Yukitoshi ID: 9000347153659

    Graduate School of Engineering (2014 from CiNii)

    Articles in CiNii:1

    • フォトサーマル・マランゴニ対流による液滴駆動(第3報) (2014)
  • Otani Yukitoshi ID: 9000347153746

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • Real-time Mapping Method of Birefringence Phase Difference by High-speed Polarization Image Sensor (2014)
  • Otani Yukitoshi ID: 9000347177168

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • Full-field imaging for spectroscopic Stokes parameters and its application to flaw inspection (2014)
  • Otani Yukitoshi ID: 9000347177193

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • z偏光を用いた3次元偏光計の開発(第1報):z偏光を用いた光軸方向の偏光特性の検出 (2014)
  • Otani Yukitoshi ID: 9000347177226

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • Three dimensional dynamic measurements using a stereo vision system and optical flow algorithms. (2014)
  • Otani Yukitoshi ID: 9000347178290

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • 光熱変換効果による単一ナノ粒子イメージング法の開発(第6報):準共通光路型干渉計を用いたナノ粒子の熱応答性測定 (2014)
  • Otani Yukitoshi ID: 9000347202914

    Utsunomiya University (2015 from CiNii)

    Articles in CiNii:1

    • 広ダイナミックレンジ光検出器を用いた高精度散乱光ストークス偏光計 (2015)
  • Otani Yukitoshi ID: 9000347203088

    Center for Optical Research & Education (2015 from CiNii)

    Articles in CiNii:1

    • 分光ストークス・フルフィールドイメージングとその欠陥検査への応用(第2報) (2015)
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