Search Results1-19 of  19

  • OZEKI Tatsuo ID: 9000000281631

    Mitsubishi Electric Corporation (1997 from CiNii)

    Articles in CiNii:1

    • High-performance 801x512-element PtSi Schottky-barrier infrared image sensor (1997)
  • OZEKI Tatsuo ID: 9000004814201

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2001 from CiNii)

    Articles in CiNii:10

    • Aiming for SIS Mixers Using Ba_<1-X>K_XBiO_3 Bicrystal Junctions (1997)
    • Optical Path Cross-Connect System Using Matrix Wavelength Division Multiplex Scheme (1999)
    • Transfer Function Matrix Measurement of AWG Multi/Demulti-Plexers (1999)
  • OZEKI Tatsuo ID: 9000107305915

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2003 from CiNii)

    Articles in CiNii:1

    • Improvement of Surface Morphology of Epitaxial Silicon Film for Elevated Source/Drain Ultrathin Silicon-on-Insulator Complementary-Metal-Oxide-Semiconductor Devices (2003)
  • OZEKI Tatsuo ID: 9000107307118

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2003 from CiNii)

    Articles in CiNii:1

    • Fabrication Of Full Hign-T_c Superconducting YBa_2Cu_3O<7-X> Trilayer Junctions Using a Polishing Technique (2003)
  • OZEKI Tatsuo ID: 9000107352468

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Specular Surface Morphology of Aluminum-Implanted 4H-SiC(0001) by SiH_4-Added Ar Anneal (2004)
  • OZEKI Tatsuo ID: 9000107389478

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Improvement of DC and RF Characteristics of AlGaN/GaN High Electron Mobility Transistors by Thermally Annealed Ni/Pt/Au Schottky Gate (2004)
  • OZEKI Tatsuo ID: 9000283546468

    Mitsubishi Electric Corp. Materials and Electronic Devices Laboratory (1989 from CiNii)

    Articles in CiNii:1

    • AN OPTIMUM DESIGN OF A HEAD AND A MEDIUM FOR A PERPENDICULAR RIGID DISK (1989)
  • OZEKI Tatsuo ID: 9000283547970

    Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • MAGNETIC PROPERTIES OF Fe-6wt%Ni/PERMALLOY MULTILAYERED FILMS (1991)
  • OZEKI Tatsuo ID: 9000283547989

    Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • SPACING LOSSES OF METAL IN GAP HEAD (1991)
  • OZEKI Tatsuo ID: 9000283548014

    Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • EDDY CURRENT AND DISPLACEMENT CURRENT ANALYSIS FOR MULTI-LAYER HEAD MATERIALS (1991)
  • Ozeki Tatsuo ID: 9000005309917

    Mitsubishi Electric Corp. Materials & Electronic Devices Laboratory (1987 from CiNii)

    Articles in CiNii:3

    • AN INTEGRATED MR HEAD, INDUCTIVE WRITE HIGH DENSITY RECORDING HEAD (1981)
    • Characteristics of Double Layer Perpendicular Disks. (1987)
    • 2)複合形薄膜磁気ヘッドの特性(録画研究会(第43回)) (1981)
  • Ozeki Tatsuo ID: 9000258157279

    Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki, Hyogo 661-8661, Japan (2001 from CiNii)

    Articles in CiNii:1

    • YBaCuO/PrBaCuO/YBaCuO Trilayer Junctions on Vicinal Substrates. (2001)
  • Ozeki Tatsuo ID: 9000258166270

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2003 from CiNii)

    Articles in CiNii:1

    • Improvement of Surface Morphology of Epitaxial Silicon Film for Elevated Source/Drain Ultrathin Silicon-on-Insulator Complementary-Metal-Oxide-Semiconductor Devices (2003)
  • Ozeki Tatsuo ID: 9000258169699

    Advanced Technology R&D Center, Mitsubishi Electric Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Specular Surface Morphology of Aluminum-Implanted 4H-SiC(0001) by SiH4-Added Ar Anneal (2004)
  • Ozeki Tatsuo ID: 9000401678104

    Articles in CiNii:1

    • Improvement in Ba 1-xKxBiO 3 Grain Boundary Junctions by Ar + Beam Irradiation (1998)
  • Ozeki Tatsuo ID: 9000401703845

    Articles in CiNii:1

    • YBaCuO/PrBaCuO/YBaCuO Trilayer Junctions on Vicinal Substrates (2001)
  • Ozeki Tatsuo ID: 9000401714982

    Articles in CiNii:1

    • Improvement of Surface Morphology of Epitaxial Silicon Film for Elevated Source/Drain Ultrathin Silicon-on-Insulator Complementary-Metal-Oxide-Semiconductor Devices (2003)
  • Ozeki Tatsuo ID: 9000401721448

    Articles in CiNii:1

    • Fabrication of Full High-TcSuperconducting YBa2Cu3O7-xTrilayer Junctions Using a Polishing Technique (2003)
  • Ozeki Tatsuo ID: 9000401723902

    Articles in CiNii:1

    • Specular Surface Morphology of Aluminum-Implanted 4H-SiC(000\bar1) by SiH4-Added Ar Anneal (2004)
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