Search Results1-20 of  36

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  • OGAMA Tetsuo ID: 9000002158232

    The University of Tokyo (2008 from CiNii)

    Articles in CiNii:1

    • The Present Status of the Management of Intellectual Properties in National Universities (2008)
  • OGAMA Tetsuo ID: 9000004958982

    Materials & Electronic Devices Lab., Mitsubishi Electric Corp. (1995 from CiNii)

    Articles in CiNii:2

    • The 18th Surface Science Lecture Course (1995)
    • Polarized Soft X-ray Absorption Spectroscopic Studies on Molecular Orientation of α-Sexithienyl Prepared by Organic Molecular Beam De position Method. (1994)
  • OGAMA Tetsuo ID: 9000005554835

    Advanced Technology R&D Center, Mitsubishi, Electric Corp. (1996 from CiNii)

    Articles in CiNii:1

    • Study of α-Sexithienyl Thin Film by Polarized Near Edge X-ray Absorption Fine Structure (1996)
  • OGAMA Tetsuo ID: 9000253649953

    Materials Engineering Laboratory, Mitsubishi Electric Corp (1983 from CiNii)

    Articles in CiNii:1

    • Humidity-sensitive Glass Films Using Heat-treated Silicone Composite Materials (1983)
  • OGAMA Tetsuo ID: 9000391753786

    東京大学産学連携本部教授知的財産部 (2015 from CiNii)

    Articles in CiNii:1

    • Management of Intellectual Properties at the University of Tokyo (2015)
  • Ogama Tetsuo ID: 9000252763573

    Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • Crystal Orientation of BiSrCaCuO (11n) Thin Films Determined by X-ray Asymmetric Reflection (1991)
  • Ogama Tetsuo ID: 9000252767487

    Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1993 from CiNii)

    Articles in CiNii:1

    • Microscopic Study of an Artificial Grain Boundary Josephson Junction in a BiSrCaCuO Thin Film Formed on a SrTiO<SUB>3</SUB>(110) Substrate Using a MgO Buffer Layer (1993)
  • Ogama Tetsuo ID: 9000252978285

    Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • Dependence of Crystal Orientation of BiSrCaCuO Thin Films on Off-Angles of Vicinal SrTiO<SUB>3</SUB> (110) Surfaces (1991)
  • Ogama Tetsuo ID: 9000252978985

    Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • Bi<SUB>2</SUB>(Sr, Ca)<SUB>3</SUB>Cu<SUB>2</SUB>O<I><SUB>x</SUB></I> and Bi<SUB>2</SUB>(Sr, Ca)<SUB>4</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> Thin Films with (11<I>n</I>) Orientation (1991)
  • Ogama Tetsuo ID: 9000252979127

    Materiais and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • BiSrCaCuO Thin Film Grown on SrTiO<SUB>3</SUB> Substrate with Off-Oriented (110) Surface (1991)
  • Ogama Tetsuo ID: 9000252979216

    Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation (1991 from CiNii)

    Articles in CiNii:1

    • Microscopic Study on (11<I>n</I>)-Oriented BiSrCaCuO Films by Cross-Sectional Transmission Electron Microscopy (1991)
  • Ogama Tetsuo ID: 9000252983371

    Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1992 from CiNii)

    Articles in CiNii:1

    • Artificial Grain Boundary Junctions in BiSrCaCuO Thin Films with (11<I>n</I>) and (001) Orientation (1992)
  • Ogama Tetsuo ID: 9000252988678

    Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1993 from CiNii)

    Articles in CiNii:1

    • (01<I>n</I>)-Oriented BiSrCaCuO Thin Films Formed on CeO<SUB>2</SUB> Buffer Layers (1993)
  • Ogama Tetsuo ID: 9000252989030

    Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation (1993 from CiNii)

    Articles in CiNii:1

    • 45° Grain Boundary Junctions in (001)-Oriented BiSrCaCuO Films (1993)
  • Ogama Tetsuo ID: 9000283158445

    Articles in CiNii:1

    • In-plane Orientation and Coincidence Site Lattice Relation of Bi2Sr2CaCu2Ox Thin Films Formed on Highly Mismatched (001) YAG Substrates. (1994)
  • Ogama Tetsuo ID: 9000392717707

    Articles in CiNii:1

    • Crystal Orientation of BiSrCaCuO (11n) Thin Films Determined by X-ray Asymmetric Reflection (1991)
  • Ogama Tetsuo ID: 9000392723221

    Articles in CiNii:1

    • Bi<SUB>2</SUB>(Sr, Ca)<SUB>3</SUB>Cu<SUB>2</SUB>O<I><SUB>x</SUB></I> and Bi<SUB>2</SUB>(Sr, Ca)<SUB>4</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> Thin Films with (11<I>n</I>) Orientation (1991)
  • Ogama Tetsuo ID: 9000392723812

    Articles in CiNii:1

    • BiSrCaCuO Thin Film Grown on SrTiO<SUB>3</SUB> Substrate with Off-Oriented (110) Surface (1991)
  • Ogama Tetsuo ID: 9000392724779

    Articles in CiNii:1

    • Artificial Grain Boundary Junctions in BiSrCaCuO Thin Films with (11<I>n</I>) and (001) Orientation (1992)
  • Ogama Tetsuo ID: 9000392725848

    Articles in CiNii:1

    • Microscopic Study on (11<I>n</I>)-Oriented BiSrCaCuO Films by Cross-Sectional Transmission Electron Microscopy (1991)
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