Search Results1-20 of  131

  • OHDOMARI Iwao ID: 9000001454032

    School of Science and Engineering, Waseda University (2005 from CiNii)

    Articles in CiNii:1

    • Si Island Formation on Domain Boundaries Induced by Ar Ion Irradiation on High-Temperature Si(111)-7 × 7 Dimer-Adatom-Stacking Fault Surfaces (2005)
  • OHDOMARI Iwao ID: 9000001463433

    School of Science and Engineering, Waseda University (2005 from CiNii)

    Articles in CiNii:1

    • Low Temperature Synthesis of Extremely Dense and Vertically Aligned Single-Walled Carbon Nanotubes (2005)
  • OHDOMARI Iwao ID: 9000005890931

    School of Science and Engineering, Waseda University (2000 from CiNii)

    Articles in CiNii:1

    • Impact of Strutural Strained Layar near SiO_2/Si Interface on Activation Energy of Time-Dependent Dielectric Breakdown (2000)
  • OHDOMARI Iwao ID: 9000006483628

    Kagami Memorial Laboratory for Material Science and Technology, Waseda University (2002 from CiNii)

    Articles in CiNii:1

    • Improvement of Focused Ion-Beam Optics in Single-Ion Implantation for Higher Aiming Precision of One-by-One Doping of Impurity Atoms into Nano-Scale Semiconductor Devices (2002)
  • OHDOMARI Iwao ID: 9000016375769

    Graduate School of Science and Engineering, Waseda University (2008 from CiNii)

    Articles in CiNii:1

    • In-plane X-ray Diffraction Profiles from Organosilane Monolayer/SiO_2 Models (2008)
  • OHDOMARI Iwao ID: 9000018506999

    Faculty of Science and Engineering, Waseda University (2011 from CiNii)

    Articles in CiNii:2

    • An Experimental Study on Relative Displacement Sensing Using Phototransistor Array for Building Structures (2010)
    • Development of Lateral Displacement Sensor for Real-Time Detection of Structural Damage (2011)
  • OHDOMARI Iwao ID: 9000018745441

    早稲田大学 (2010 from CiNii)

    Articles in CiNii:1

    • 711 A Relative-Story Displacement Sensor for Structural Health Monitoring Capable of Measuring the Local Inclination Angle and the Relative Displacement (2010)
  • OHDOMARI Iwao ID: 9000020295843

    早稲田大学・理工学部 (1986 from CiNii)

    Articles in CiNii:1

    • Structures and defects of heterogeneous interfaces. (1986)
  • OHDOMARI Iwao ID: 9000021501418

    早稲田大学 (2011 from CiNii)

    Articles in CiNii:1

    • A Relative-Story Displacement Sensor for Structural Health Monitoring Capable of Measuring the Local Inclination Angle and the Relative Displacement (2011)
  • OHDOMARI Iwao ID: 9000021510782

    School of Science and Engineering, Waseda University (1975 from CiNii)

    Articles in CiNii:1

    • On the New ESR Center Observed in Heavily Ar<SUP>+</SUP> Implanted Si (1975)
  • OHDOMARI Iwao ID: 9000021527952

    School of Science and Engineering, Waseda University (1979 from CiNii)

    Articles in CiNii:1

    • Fabrication Technique and Characterization of Metal Silicides (1979)
  • OHDOMARI Iwao ID: 9000045507482

    School of Science and Engineering, Waseda University (1980 from CiNii)

    Articles in CiNii:1

    • Interface Reaction of SiO_2 and GaAs during High-Temperature Heat-Treatments (1980)
  • OHDOMARI Iwao ID: 9000107306341

    School of Science and Engineering, Waseda University (2003 from CiNii)

    Articles in CiNii:1

    • Fabrication of ultrathin Si Channel Wall For Vertical Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistor (DG MOSFET) by Using Ion-Bombardment-Retarded Etching (IBRE) (2003)
  • OHDOMARI Iwao ID: 9000107308138

    Articles in CiNii:1

    • Reduction of Fluctuation in Semiconductor Conductivity by One-by-One Ion Implantation of Dopant Atoms (2000)
  • OHDOMARI Iwao ID: 9000107321477

    Faculty of Science and Engineering, Waseda University (2008 from CiNii)

    Articles in CiNii:1

    • Transconductance enhancement of strained-Si nanowire FETs (2008)
  • OHDOMARI Iwao ID: 9000107335029

    Kagami Memorial Laboratory for Materials Science and Technology, Waseda University (2001 from CiNii)

    Articles in CiNii:1

    • Novel Process for High-Density Buried Nanopyramid Array Fabrication by Means of Dopant Ion Implantation and Wet Etching (2001)
  • OHDOMARI Iwao ID: 9000107338763

    School of Science and Engineering, Waseda University (2004 from CiNii)

    Articles in CiNii:1

    • Large-Scale Atomistic Modeling of Thermally Grown SiO_2 on Si(111) Substrate (2004)
  • OHDOMARI Iwao ID: 9000107341187

    School of Science and Engineering, Waseda University (2004 from CiNii)

    Articles in CiNii:1

    • Electron Beam Lithography on Organosilane Self-Assembled Monolayer Resist (2004)
  • OHDOMARI Iwao ID: 9000107345083

    School of Science and Engineering, Waseda University (2005 from CiNii)

    Articles in CiNii:1

    • Analysis of Interactions between Green Fluorescent Protein and Silicon Substrates Using Molecular Dynamics Simulations (2005)
  • OHDOMARI Iwao ID: 9000107350322

    School of Science and Engineering, Waseda University (2011 from CiNii)

    Articles in CiNii:1

    • Enhancing Single-Ion Detection Efficiency by Applying Substrate Bias Voltage for Deterministic Single-Ion Doping (2011)
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