Search Results1-16 of  16

  • Ohta Hironori ID: 9000007126999

    Articles in CiNii:1

    • Influence of Relaxation on Migration of Ions During Ion Exchange by Electrolysis in Glass (1978)
  • Ohta Hironori ID: 9000017599167

    Articles in CiNii:1

    • Ion exchange in sheet glass by electrolysis-2-Migration of K+ ions from the K+ ion-exchanged layer under the reverse electric field (1972)
  • Ohta Hironori ID: 9000017599223

    Articles in CiNii:1

    • Ion exchange in sheet glass by electrolysis (1970)
  • OHTA Hironori ID: 9000002470625

    Hokkaido University Graduate School of Dental Medicine (2002 from CiNii)

    Articles in CiNii:1

    • Roles of Integrin β3 in Enhancement of Cell Motility by HOXD3 Overexpression (2002)
  • OHTA Hironori ID: 9000003015596

    Jisso Research Laboratories, NEC Corporation (2004 from CiNii)

    Articles in CiNii:4

    • CSP実装の製造・試験プロセス (実装技術ガイドブック1999年) -- (BGA/CSP編) (1999)
    • The Destruction Mode and the Life Cycle Times of the Chip Size Package Mounted on the Circuit Board by the Bending Test (2001)
    • Ultra-Thin High-Density Packaging Substrate for High-Performance CSPs and SiPs (2004)
  • OHTA Hironori ID: 9000017724202

    Graduate School of Engineering, NIT (2010 from CiNii)

    Articles in CiNii:1

    • 21527 Seismic Ground motion Indices and the Building Damage (2010)
  • OHTA Hironori ID: 9000020580852

    Articles in CiNii:1

    • Migration of K<sup>+</sup> Ions from the K<sup>+</sup> Ion-Exchanged Layer under the Reverse Electric Field (1972)
  • OHTA Hironori ID: 9000020625499

    Articles in CiNii:1

    • Strength and Fracture Behaviour of the Ion-Exchanged Glass (1972)
  • OHTA Hironori ID: 9000021989899

    Articles in CiNii:1

    • Ion-Exchange in Sheet Glass by Electrolysis (1970)
  • OHTA Hironori ID: 9000254968492

    Asahi Glass Co., Ltd, Research & Development Div. (1985 from CiNii)

    Articles in CiNii:1

    • Techniques of staining in glass. (1985)
  • OHTA Hironori ID: 9000256073738

    Packaging Technology Center, Production Technology Laboratories, NEC Corporation (2001 from CiNii)

    Articles in CiNii:1

    • The Destruction Mode and the Life Cycle Times of the Chip Size Package Mounted on the Circuit Board by the Bending Test. (2001)
  • Ohta Hironori ID: 9000016900528

    Articles in CiNii:1

    • HOXD3-overexpression increases integrin alphavbeta3 expression and deprives E-cadherin while it enhances cell motility in A549 cells. (2006)
  • Ohta Hironori ID: 9000252941395

    Research Laboratory, Asahi Glass Co. Ltd. (1975 from CiNii)

    Articles in CiNii:1

    • The Effect of Coating with Inorganic Film on the Strength of Etched Glass (1975)
  • Ohta Hironori ID: 9000258392338

    NEC Corporation (2008 from CiNii)

    Articles in CiNii:1

    • Study of acceleration of insulation reliability examination (2008)
  • Ohta Hironori ID: 9000392676361

    Articles in CiNii:1

    • The Effect of Coating with Inorganic Film on the Strength of Etched Glass (1975)
  • Ohta Hironori ID: 9000401579512

    Articles in CiNii:1

    • The Effect of Coating with Inorganic Film on the Strength of Etched Glass (1975)
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