Search Results1-20 of  25

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  • ONABE Hideaki ID: 9000005563118

    Raytech Corporation (2011 from CiNii)

    Articles in CiNii:11

    • Low Exposure X-ray Transmission Measurements for Contrast Media Detection with Filtered X-rays (2003)
    • Energy Measurement of X-rays in Computed Tomography for Detecting Contrast Media (2008)
    • A Current-Mode Detector for Unfolding X-ray Energy Distribution (2008)
  • ONABE Hideaki ID: 9000107347108

    Raytech Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Resistivity Measurements of Directly Bonded Si Wafers (2004)
  • ONABE Hideaki ID: 9000392062185

    REITEKKU (2003 from CiNii)

    Articles in CiNii:1

    • Alpha Particle Measurement using Si Radiation Detector with Frisch Grid (2003)
  • Onabe Hideaki ID: 9000082780861

    Articles in CiNii:1

    • Interface Resistivity of Directly Bonded Si Wafers (2006)
  • Onabe Hideaki ID: 9000239868067

    Articles in CiNii:1

    • Low dose exposure diagnosis with a transXend detector aiming for iodine-marked cancer detection (2012)
  • Onabe Hideaki ID: 9000258123065

    Raytech Co., Ltd., Utsunomiya, Tochigi 321 (1994 from CiNii)

    Articles in CiNii:1

    • Development of Lithium-Drifted Silicon Detectors Using an Automatic Lithium-Ion Drift Apparatus. (1994)
  • Onabe Hideaki ID: 9000258123166

    Raytech Co., Ltd., Utsunomiya, Tochigi 321 (1994 from CiNii)

    Articles in CiNii:1

    • Stability of a Lithium-Drifted Silicon Detector. (1994)
  • Onabe Hideaki ID: 9000258170443

    Raytech Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Resistivity Measurements of Directly Bonded Si Wafers (2004)
  • Onabe Hideaki ID: 9000258301627

    Raytech Co. (2004 from CiNii)

    Articles in CiNii:1

    • Study on the Development of Low Exposure CT with Frisch Grid Avalanche Diode Detector (2004)
  • Onabe Hideaki ID: 9000258303191

    Raytech Co. (2004 from CiNii)

    Articles in CiNii:1

    • Study on the Development of Low Exposure CT with Frisch Grid Avalanche Diode Detector (2004)
  • Onabe Hideaki ID: 9000258304409

    Raytech (2013 from CiNii)

    Articles in CiNii:1

    • Imaging on a complicated shape phantom with a transXend detector (2013)
  • Onabe Hideaki ID: 9000283896782

    Raytech Corp. (2012 from CiNii)

    Articles in CiNii:1

    • X-ray imaging by multivariate analysis on the transXend detector output currents for ultra-low dose exposure diagnosis (2012)
  • Onabe Hideaki ID: 9000299563770

    Articles in CiNii:1

    • Measurement of effective atomic numbers using energy-resolved computed tomography (2014)
  • Onabe Hideaki ID: 9000392076428

    Raytech Corporation (2007 from CiNii)

    Articles in CiNii:1

    • Measurement of Iodine Contrast Media by X-ray CT with Energy Subtraction Method:Experiment with CdZnTe Detector (2007)
  • Onabe Hideaki ID: 9000392076434

    Raytech Corporation (2007 from CiNii)

    Articles in CiNii:1

    • Measurement of Iodine Contrast Media by X-ray CT with Energy Subtraction Method:(1)Feasibility Study by Simulation (2007)
  • Onabe Hideaki ID: 9000392082958

    Raytech Corp. (2006 from CiNii)

    Articles in CiNii:1

    • Resistivity Estimation of the Interface of Si Wafers Bonded by Surface Activation Method (2006)
  • Onabe Hideaki ID: 9000392097774

    Raytech (2009 from CiNii)

    Articles in CiNii:1

    • Energy Subtraction CT measured by a Current Mode Detector called transXend (2009)
  • Onabe Hideaki ID: 9000392114347

    Raytech (2007 from CiNii)

    Articles in CiNii:1

    • Comparison of Current and Energy Measurement Methods of X-rays in Iodine Contrast Media Detection (2007)
  • Onabe Hideaki ID: 9000392116419

    Raytech (2012 from CiNii)

    Articles in CiNii:1

    • Low Dose Exposure Energy Resolved X-ray CT with Multivariate Analysis Method (2012)
  • Onabe Hideaki ID: 9000392124355

    Raytech (2010 from CiNii)

    Articles in CiNii:1

    • Demonstration of transXend Detector Employing CdTe Flat-panel Detector (2010)
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