Search Results1-4 of  4

  • OOISHI Tsukasa ID: 9000004813745

    ULSI Development Center, Mitsubishi Electric Corporation (1999 from CiNii)

    Articles in CiNii:5

    • A Mixed-Mode Voltage Down Converter with Impedance Adjustment Circuitry for Low-Voltage High-Frequency Memories (1996)
    • Features of SOI DRAM's and their Potential for Low-Voltage and/or Giga-Bit Scale DRAM's (1996)
    • A Board Level Parallel Test Circuit and a Short Circuit Failure Repair Circuit for High-Density, Low-Power DRAMs (1997)
  • Ooishi Tsukasa ID: 9000004870974

    ULSI Laboratory, Mitsubishi Electric Corporation (1993 from CiNii)

    Articles in CiNii:1

    • A Line-Mode Test with Data Register for ULSI Memory Architecture (Special Issue on LSI Memories) (1993)
  • Ooishi Tsukasa ID: 9000258451145

    ルネサステクノロジ (2004 from CiNii)

    Articles in CiNii:1

    • Self-Reference Sense Amplifier for MRAM(Magnetic-Random-Access-Memory) (2004)
  • Ooishi Tsukasa ID: 9000258453090

    Renesas Technology Corp. (2005 from CiNii)

    Articles in CiNii:1

    • A Study of Dual Port Memory with a MRAM Memory Cell (2005)
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