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  • OSHIKIRI Masamitsu ID: 9000004812826

    Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION (1996 from CiNii)

    Articles in CiNii:1

    • A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices (1996)
  • Oshikiri Masamitsu ID: 9000004872673

    Semiconductor Device Engineering Laboratory, Toshiba Corporation (1994 from CiNii)

    Articles in CiNii:1

    • A 16-Mb Flash EEPROM with a New Self-Data-Refresh Scheme for a Sector Erase Operation (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994)) (1994)
  • Oshikiri Masamitsu ID: 9000256679445

    Faculty of Engineering, Hokkaido University (1989 from CiNii)

    Articles in CiNii:1

    • Characterization of pitch/oxygen plasma treated carbon black systems by means of high temperature ESR (1989)
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