Search Results1-4 of  4

  • PARK Yang-Keun ID: 9000005716962

    School of Electrical and Computer Engineering, Sungkyunkwan University (2001 from CiNii)

    Articles in CiNii:7

    • Well Structure by High Energy Boron Implantation for Soft Error Reduction in DRAMs (1996)
    • Microanalysis of Impurity Contamination in Masklessly Etched Area Using Focused Ion Beam (1998)
    • Microprobe Analysis of Pt Films Deposited by Beam Induced Reaction (1999)
  • Park Yang-Keun ID: 9000401652558

    Articles in CiNii:1

    • Well Structure by High-Energy Boron Implantation for Soft-Error Reduction in Dynamic Randam Access Memories (DRAMs) (1995)
  • Park Yang-Keun ID: 9000401668187

    Articles in CiNii:1

    • Microanalysis of Impurity Contamination in Masklessly Etched Area Using Focused Ion Beam (1997)
  • Park Yang-Keun ID: 9000401676046

    Articles in CiNii:1

    • Microprobe Analysis of Pt Films Deposited by Beam Induced Reaction (1998)
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