Search Results1-3 of  3

  • Rorsman Niklas ID: 9000046554064

    Articles in CiNii:1

    • Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation (2010)
  • Rorsman Niklas ID: 9000402036443

    Articles in CiNii:1

    • AlGaN/GaN high electron mobility transistors with intentionally doped GaN buffer using propane as carbon precursor (2016)
  • Rorsman Niklas ID: 9000402614223

    Articles in CiNii:1

    • 2019-05-20 (2019)
Page Top