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  • Ryu Hyukhyun ID: 9000052272637

    Articles in CiNii:1

    • Study of Nickel Silicide Thermal Stability Using Silicon-on-Insulator Substrate for Nanoscale Complementary Metal Oxide Semiconductor Field-Effect Transisor Device (2008)
  • Ryu Hyukhyun ID: 9000052292408

    Articles in CiNii:1

    • Effects of Strained Silicon Layer on Nickel (Germano)silicide for Nanoscale Complementary Metal Oxide Semiconductor Field-Effect Transistor Device (2008)
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