Search Results1-13 of  13

  • Sano Harunobu ID: 9000024936620

    Articles in CiNii:1

    • Effects of Grain Boundary and Segregated-Phases on Reliability of Ba(Ti,Zr)O3-Based Ni Electrode MLCs (Special Issue: Ferroelectric Materials and Their Applications) (2005)
  • SANO Harunobu ID: 9000006467105

    Murata Manufacturing Co., Ltd. (2002 from CiNii)

    Articles in CiNii:1

    • Effects of Rare-Earth Oxides on the Reliability of X7R Dielectrics (2002)
  • SANO Harunobu ID: 9000020598647

    Articles in CiNii:1

    • Microstructural Change of Polycrystalline Ba-Ferrite (BaO⋅6Fe<sub>2</sub>O<sub>3</sub>) by Hot-Extrusion Processing (1987)
  • Sano Harunobu ID: 9000024988007

    Articles in CiNii:1

    • Relationship between Dielectric Properties and Microphonics of Mulutilayer Ceramic Capacitors (Special Issue: Ferroelectric Materials and Their Applications) (2006)
  • Sano Harunobu ID: 9000258153777

    Murata Mfg. Co., Ltd., 2-26-10 Tenjin, Nagaokakyo-shi, Kyoto 617-8555, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Effect of Microstructure on Reliability of Ca(TiZr)O3-Based Multilayer Ceramic Capacitors. (2000)
  • Sano Harunobu ID: 9000258185004

    Murata Manufacturing. Co., Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Effects of Grain Boundary and Segregated-Phases on Reliability of Ba(Ti,Zr)O3-Based Ni Electrode MLCs (2005)
  • Sano Harunobu ID: 9000391859706

    Murata Manufacturing Co., Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Dielectric Properties and Microstructure of Mg<sub>2</sub>SiO<sub>4</sub>-SrTiO<sub>3</sub> Ceramics (2005)
  • Sano Harunobu ID: 9000391886372

    Murata Manufacturing Co., Ltd. (2008 from CiNii)

    Articles in CiNii:1

    • The Development of Dielectric Materials for High Temperature Guaranteed Multilayer Ceramic Capacitors (2008)
  • Sano Harunobu ID: 9000401683000

    Articles in CiNii:1

    • BaTiO3-Based Non-Reducible Low-Loss Dielectric Ceramics (1999)
  • Sano Harunobu ID: 9000401691698

    Articles in CiNii:1

    • Effect of Microstructure on Reliability of Ca(TiZr)O3-Based Multilayer Ceramic Capacitors (2000)
  • Sano Harunobu ID: 9000401709494

    Articles in CiNii:1

    • Effects of Rare-Earth Oxides on the Reliability of X7R Dielectrics (2002)
  • Sano Harunobu ID: 9000401741085

    Articles in CiNii:1

    • Effects of Grain Boundary and Segregated-Phases on Reliability of Ba(Ti,Zr)O3-Based Ni Electrode MLCs (2005)
  • Sano Harunobu ID: 9000402052335

    Articles in CiNii:1

    • Insulation resistance degradation mechanisms of multilayer ceramic capacitors during highly accelerated temperature and humidity stress tests (2018)
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