Search Results1-20 of  37

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  • SATO Tomoshige ID: 9000005565665

    JEOL (1995 from CiNii)

    Articles in CiNii:1

    • Low-Energy Electron Diffraction and Scanning Tunneling Microscopy Study on the Reconstruction of the Vanadium (111)Surface (1995)
  • SATO Tomoshige ID: 9000020150397

    JEOL LTD. (1990 from CiNii)

    Articles in CiNii:1

    • Microstructure and elemental features of various stainless steel surfaces. Electro-polished, buff-polished, belt-polished and as-received. (1990)
  • SATO Tomoshige ID: 9000020228188

    JEOL LTD. (1990 from CiNii)

    Articles in CiNii:1

    • Microstructure and elemental features of vacuum-fired(1050.DEG.C.) stainless steel surface. (1990)
  • SATO Tomoshige ID: 9000107355606

    JEOL Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy (1997)
  • SATO Tomoshige ID: 9000252915577

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • A High-Temperature and Low-Temperature UHV-STM. (1993)
  • SATO Tomoshige ID: 9000253325477

    JEOL Ltd (1992 from CiNii)

    Articles in CiNii:1

    • Real-time observation of the Si surface with high-temperature UHV-STM (1992)
  • SATO Tomoshige ID: 9000253648124

    JEOL LTD (1992 from CiNii)

    Articles in CiNii:1

    • Three Dimensional Analysis by Auger Electron Spectroscopy. (1992)
  • SATO Tomoshige ID: 9000253649293

    JEOL Ltd. (1998 from CiNii)

    Articles in CiNii:1

    • Dynamic Behavior of Surface Atoms on Si(001) and Ge(001) Observed by Variable Temperature STM. (1998)
  • SATO Tomoshige ID: 9000253649414

    JEOL Ltd. (1998 from CiNii)

    Articles in CiNii:1

    • Direct Heating of a Sample in STM. (1998)
  • SATO Tomoshige ID: 9000253649721

    JEOL Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • Measurement of the Sample Temperature in STM. (1999)
  • SATO Tomoshige ID: 9000253650222

    JEOL Ltd. (1987 from CiNii)

    Articles in CiNii:1

    • Topographic compensation in auger electron spectroscopy. (1987)
  • Sato Tomoshige ID: 9000252985130

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Scanning Tunneling Microscopy Observation of Ar-Ion-Bombarded Si(001) Surfaces and Regrowth Processes by Thermal Annealing (1993)
  • Sato Tomoshige ID: 9000252986222

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • High-Temperature Scanning Tunneling Microscopy Observation of a (15, 17, 1) Facet Structure on a Si(110) Surface (1993)
  • Sato Tomoshige ID: 9000252987006

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Dynamic Observation of Ag Desorption Process on Si(111) Surface by High-Temperature Scanning Tunneling Microscopy (1993)
  • Sato Tomoshige ID: 9000252987063

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Adsorption of Bismuth on Si(110) Surfaces Studied by Scanning Tunneling Microscopy (1993)
  • Sato Tomoshige ID: 9000252987271

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Real-Time Observation of (1×1)–(7×7) Phase Transition on Vicinal Si(111) Surfaces by Scanning Tunneling Microscopy (1993)
  • Sato Tomoshige ID: 9000252988892

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • High-Temperature Scanning Tunneling Microscopy Study of the Phase Transition of 16-Structure Appearing on a Si(110) Surface (1993)
  • Sato Tomoshige ID: 9000258137488

    JEOL Ltd., 3–1–2 Musashino, Akishima, Tokyo 196, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy. (1997)
  • Sato Tomoshige ID: 9000258152919

    JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Scanning Tunneling Microscopy Observation of the Formation of the Smallest Dimer-Adatom-Stacking-fault Domain on a Quenched Si(111) Surface. (2000)
  • Sato Tomoshige ID: 9000258701349

    JEOL (2006 from CiNii)

    Articles in CiNii:1

    • Molecular-sized Observation of Organic Crystal using Non-contact AFM (2006)
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