Search Results1-20 of  27

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  • SATOH SHIGEO ID: 9000254272554

    Faculty of Agriculture, Imperial University of Tokyo (1932 from CiNii)

    Articles in CiNii:1

    • A STUDY OF REPRODUCTION IN THE MARE (REPORT I) (1932)
  • SATOH SHIGEO ID: 9000254272583

    Faculty of Agriculture, Tokyo Imperial University (1933 from CiNii)

    Articles in CiNii:1

    • A STUDY OF REPRODUCTION IN THE MARE:II. THE STUDY ON THE OESTRUS (1933)
  • SATOH Shigeo ID: 9000001496875

    Advanced LSI Development Division, FUJITSU Limited (2005 from CiNii)

    Articles in CiNii:2

    • Novel Extraction Method for Size-Dependent Mobility Based on BSIM3-Like Compact Model (2005)
    • Analysis and modeling of size dependent mobility enhancement due to mechanical stress (2004)
  • SATOH Shigeo ID: 9000001717712

    Fujitsu Laboratories Ltd. (1998 from CiNii)

    Articles in CiNii:1

    • Scaling Law for Secondary Cosmic-Ray Neutron-Induced Soft-Errors in DRAMs (1998)
  • SATOH Shigeo ID: 9000002166101

    FUJITSU Ltd. (2004 from CiNii)

    Articles in CiNii:1

    • Dopant Profile Design Methodology for 65nm Generation via Inverse Modeling (2004)
  • SATOH Shigeo ID: 9000002171341

    Fujitsu Laboratories Ltd. (2007 from CiNii)

    Articles in CiNii:3

    • Neutron-induced Soft-Error Simulation Technology for Logic Circuits (2005)
    • Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops (2006)
    • Novel Soft Error Hardened Latches and Flip-Flops (2007)
  • SATOH Shigeo ID: 9000004036543

    Department of Cardiovascular Surgery, Osaka Medical Center for Cancer and Cardiovascular Diseases (1997 from CiNii)

    Articles in CiNii:1

    • A Case of Arrhythmogenic Right Ventricular Dysplasia With Left and Right Ventricular Hypofunction in an Elderly Subject -Long-Term Follow-Up- (1997)
  • SATOH Shigeo ID: 9000004778007

    FUJITSU LABORATORIES LTD. (2007 from CiNii)

    Articles in CiNii:17

    • LSI信頼性向上のための宇宙線中性子ソフトエラー解析シミュレータ (特集:インターネット時代の開発スピードを実現する設計シミュレーション) -- (電子回路シミュレーション) (2000)
    • Parameter Extraction of Hydrodynamic Model by Using Fullband Monte Carlo Simulator (1997)
    • Development of tool for analyzation of neutron induced soft error (1998)
  • SATOH Shigeo ID: 9000004813726

    Fujitsu Laboratories Ltd. (1996 from CiNii)

    Articles in CiNii:2

    • Impact of Current Gain Increment Effect on Alpha Particle Induced Soft Errors in SOI DRAMs (1996)
    • Theoretical Study of Alpha-Particle-Induced Soft Errors in Submicron SOI SRAM (1996)
  • SATOH Shigeo ID: 9000004970088

    Fujitsu Microelectronics Limited (2009 from CiNii)

    Articles in CiNii:9

    • Performance Boost using a New Device Design Methodology Based on Characteristic Current for Low-Power CMOS (2007)
    • Suppression of Defect Formation and Their Impact on Short Channel Effects and Drivability of pMOSFET with SiGe Source/Drain (2007)
    • MOSFET Current Drive Optimization Using Silicon Nitride Capping Layer (2004)
  • SATOH Shigeo ID: 9000256531032

    Articles in CiNii:1

    • Studies on the acclimatization and haredity of Sake yeast. Part 3:Variation of the fermenting power by acclimatizing (2) On the “one-fifteenth fermentation test” (1951)
  • SATOH Shigeo ID: 9000256572555

    釧路北部地区農業改良普及所 (1981 from CiNii)

    Articles in CiNii:1

    • Control of the Solanum Flea Beetle by Application of Some Insecticides (1981)
  • Satoh Shigeo ID: 9000018306390

    Fujitsu Laboratories Ltd. (1994 from CiNii)

    Articles in CiNii:2

    • 数値解析技術 (超微細半導体シミュレ-ション技術--21世紀へ向けた限界への挑戦<特集>) (1991)
    • Soft-Error Simulation System (1994)
  • Satoh Shigeo ID: 9000025097165

    Articles in CiNii:1

    • Neutron-Induced Soft-Error Simulation Technology for Logic Circuits (Special Issue: Solid State Devices & Materials) (2006)
  • Satoh Shigeo ID: 9000071338960

    Articles in CiNii:1

    • Potential of and Issues with Multiple-Stressor Technology in High-Performance 45 nm Generation Devices (2007)
  • Satoh Shigeo ID: 9000072141275

    Articles in CiNii:1

    • Technological Trends of Soft Error Estimation Based on Accurate Estimation Method (2006)
  • Satoh Shigeo ID: 9000072238690

    Articles in CiNii:1

    • Soft Error Hardened Latch and Its Estimation Method (2008)
  • Satoh Shigeo ID: 9000252984629

    Articles in CiNii:1

    • Analytical Models for Symmetric Thin-Film Double-Gate Silicon-on-Insulator Metal-Oxide-Semiconductor-Field-Effect-Transistors (1993)
  • Satoh Shigeo ID: 9000255857647

    Articles in CiNii:1

    • Studies on the Acclimatization and Heredity of Sake Yeast. Part 4:Variation of the fermenting power by acclimatiziny (3) On the “fundamental fermentation test” (1951)
  • Satoh Shigeo ID: 9000258181262

    Advanced LSI Development Division, FUJITSU Limited (2005 from CiNii)

    Articles in CiNii:1

    • Novel Extraction Method for Size-Dependent Mobility Based on BSIM3-Like Compact Model (2005)
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