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  • SCHIBLI Thomas R. ID: 9000001998346

    Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST) (2007 from CiNii)

    Articles in CiNii:1

    • Precision Length Metrology Based on the Time and Frequency Standards Using Optical Combs (2007)
  • Schibli Thomas R. ID: 9000402019640

    Articles in CiNii:1

    • Nondegradative Dielectric Coating on Graphene by Thermal Evaporation of SiO (2013)
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