Search Results1-2 of  2

  • SHIBUSAWA Masahiro ID: 9000000615976

    Saitama University (2001 from CiNii)

    Articles in CiNii:2

    • Electrical Breakdown Characteristics of Electroformed Copper Surface in Vacuum (2001)
    • Electrical Breakdown Characteristics of Electroformed Oxygen-free Copper Electrodesin Vacuum (2000)
  • SHIBUSAWA Masahiro ID: 9000020103386

    Department of Electrical and Electronic Systems, Saitama University (2001 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (2001)
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