Search Results101-120 of  215

  • Shigekawa Hidemi ID: 9000258183807

    Institute of Applied Physics, 21st Century COE, CREST JST, University of Tsukuba (2005 from CiNii)

    Articles in CiNii:1

    • Analysis of Time-Resolved Tunnel Current Signal in Sub-Picosecond Range Observed by Shaken-Pulse-Pair-Excited Scanning Tunneling Miscroscopy (2005)
  • Shigekawa Hidemi ID: 9000258183989

    Institute of Applied Physics, University of Tsukuba (2005 from CiNii)

    Articles in CiNii:1

    • Atomic Force Microscopy on Imogolite, Aluminosilicate Nanotube, Adsorbed on Au(111) Surface (2005)
  • Shigekawa Hidemi ID: 9000258700086

    Institute of Applied Physics University of Tsukuba|CREST|21st century COE (2004 from CiNii)

    Articles in CiNii:1

    • STM observation of superstructure of glycine on Cu(100) (2004)
  • Shigekawa Hidemi ID: 9000258700638

    Univ of Tsukuba, Inst. Appl. Phys. (2004 from CiNii)

    Articles in CiNii:1

    • Probe effect in scanning tunneling microscopy on Si(001) low-temperature phases (2004)
  • Shigekawa Hidemi ID: 9000258701026

    Inst. Appl. Phys, Univ. of Tsukuba, 21st COE, CREST (2006 from CiNii)

    Articles in CiNii:1

    • Probing nanoscale carrier transport in GaAs p-n junction by laser combined Scanning Tunneling Microscopy (2006)
  • Shigekawa Hidemi ID: 9000258701424

    Articles in CiNii:1

    • STM light emission spectroscopy of Rubrene thin films on Au and graphite (2006)
  • Shigekawa Hidemi ID: 9000258701545

    Institute of Applied Physics, University of Tsukuba, 21stCOE, CREST-JST (2006 from CiNii)

    Articles in CiNii:1

    • Precise and Reliable Approach to Single-Molcule Conductance Measurement by "Point Contact Method" with STM (2006)
  • Shigekawa Hidemi ID: 9000258701556

    Inst. of Appl. Phys., Univ. of Tsukuba|CREST-JST|21st Century COE (2006 from CiNii)

    Articles in CiNii:1

    • Ultrafast photoinduced carrier dynamics in GaNAs probed by femtosecond time-resolved scanning tunneling microscopy (2006)
  • Shigekawa Hidemi ID: 9000258701918

    Institute of Applied Physics, University of Tsukuba|CREST_JST|21st Century COE (2006 from CiNii)

    Articles in CiNii:1

    • Development of variable-temperature four-probe scanning tunneling microscope (2006)
  • Shigekawa Hidemi ID: 9000258702302

    Univ. of Tsukuba|CREST-JST (2007 from CiNii)

    Articles in CiNii:1

    • Photo-induced Carrier Dynamics in WSe2 Probed by Femtosecond Time-resolved STM (2007)
  • Shigekawa Hidemi ID: 9000258702358

    Inst. of Appl Phys, Univ. of Tsukuba (2007 from CiNii)

    Articles in CiNii:1

    • Potential fluctuation around point defects in semiconductor visualized by Photoassisted Scanning Tunneling Microscopy (2007)
  • Shigekawa Hidemi ID: 9000258702763

    Inst. of Appl Phys, Univ. of Tsukuba (2007 from CiNii)

    Articles in CiNii:1

    • Reversible defect engineering of a single-walled carbon nanotubes with STM (2007)
  • Shigekawa Hidemi ID: 9000258702794

    University of Tsukuba, CREST-JST (2007 from CiNii)

    Articles in CiNii:1

    • Development of variable-temperature four-probe STM (2007)
  • Shigekawa Hidemi ID: 9000258702819

    Inst. of Appl. Phys., Univ. of Tsukuba|CREST JST (2007 from CiNii)

    Articles in CiNii:1

    • Selective Analysis of Biotin-Streptavidin Potential Barriers using Dynamic Force Spectroscopy (2007)
  • Shigekawa Hidemi ID: 9000258702980

    Inst. of Appl. Phys. Univ. of Tsukuba|CREST-JST (2008 from CiNii)

    Articles in CiNii:1

    • Site-Selective Anatomy of Biotin-Streptavidin Interactions using Dynamic Force Spectroscopy (2008)
  • Shigekawa Hidemi ID: 9000258704060

    Institute of Applied Physics, University of Tsukuba|CREST-JST (2009 from CiNii)

    Articles in CiNii:1

    • Single Molecular Conductance Measurement by STM Using Si Electrodes (2009)
  • Shigekawa Hidemi ID: 9000258704317

    Inst. of Appl. Phys., Univ. of Tsukuba|CREST-JST (2009 from CiNii)

    Articles in CiNii:1

    • Investigating of Streptavidin/Avidin-Biotin Bonding Processes Using Dynamic Force Spectroscopy (2009)
  • Shigekawa Hidemi ID: 9000258704547

    Tsukuba Univ. faclty of enginering (2009 from CiNii)

    Articles in CiNii:1

    • Spatial resolution of femtosecond time-resolved STM (2009)
  • Shigekawa Hidemi ID: 9000258704786

    Institute of Applied Physics, University of Tsukuba (2011 from CiNii)

    Articles in CiNii:1

    • Performance improvement of pre-amplifier for multi-probe STM (2011)
  • Shigekawa Hidemi ID: 9000258705014

    Institute of Applied of Physics, University of Tsukuba (2011 from CiNii)

    Articles in CiNii:1

    • Investigation of carrier capture dynamics at metal nanoparticles on GaAs by time-resolved STM (2011)
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