Search Results1-9 of  9

  • SHIKAMA Shozo ID: 9000001655254

    Mitsubishi Electric Corporation, ULSI Laboratory (1996 from CiNii)

    Articles in CiNii:1

    • Highly Reliable Gate Oxides Formed by UV-O_2 Oxidation (1996)
  • SHIKAMA Shozo ID: 9000005654412

    Faculty of Engineering Science, Osaka University (1995 from CiNii)

    Articles in CiNii:2

    • Efficient Field Effect in Heavily Doped Thin-Film Diamond Metal-Insulator-Semiconductor Diode Employing BaTiO_3 Insulator Film (1994)
    • Fermi Level Pinning in Metal-Insulator-Diamond Structures (1995)
  • Shikama Shozo ID: 9000252988313

    Faculty of Engineering Science, Osaka University (1993 from CiNii)

    Articles in CiNii:1

    • Depth Profile Measurement of Activated Boron-Concentration in Diamond Thin Films Utilizing Schottky Diode <I>C</I>-<I>V</I> Curves (1993)
  • Shikama Shozo ID: 9000258122861

    Faculty of Engineering Science, Osaka University, 1–1 Machikaneyama–cho, Toyonaka, Osaka 560 (1994 from CiNii)

    Articles in CiNii:1

    • Efficient Field Effect in Heavily Doped Thin-Film Diamond Metal-Insulator-Semiconductor Diode Employing BaTiO3 Insulator Film. (1994)
  • Shikama Shozo ID: 9000258127159

    Faculty of Engineering Science, Osaka University, 1–3 Machikaneyama, Toyonaka, Osaka 560, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Fermi Level Pinning in Metal-Insulator-Diamond Structures. (1995)
  • Shikama Shozo ID: 9000392736713

    Articles in CiNii:1

    • Depth Profile Measurement of Activated Boron-Concentration in Diamond Thin Films Utilizing Schottky Diode <I>C</I>-<I>V</I> Curves (1993)
  • Shikama Shozo ID: 9000401638438

    Articles in CiNii:1

    • Depth Profile Measurement of Activated Boron-Concentration in Diamond Thin Films Utilizing Schottky DiodeC-VCurves (1993)
  • Shikama Shozo ID: 9000401647413

    Articles in CiNii:1

    • Efficient Field Effect in Heavily Doped Thin-Film Diamond Metal-Insulator-Semiconductor Diode Employing $\bf BaTiO_{3}$ Insulator Film (1994)
  • Shikama Shozo ID: 9000401654335

    Articles in CiNii:1

    • Fermi Level Pinning in Metal-Insulator-Diamond Structures (1995)
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