Search Results1-20 of  106

  • SUDO TOSHIO ID: 9000005336168

    Geological and Mineralogical Institute, Faculty of Science, Tokyo University of Education (1970 from CiNii)

    Articles in CiNii:1

    • 1969 INTERNATIONAL CLAY CONFERENCE, TOKYO (1970)
  • SUDO TOSHIO ID: 9000254356076

    Geological and Mineralogical Institute, Faculty of Science, Tokyo University of Education (1957 from CiNii)

    Articles in CiNii:1

    • DIASPORE FOUND IN ASSOCIATION WITH ZINCBLENDE AND PYRITE ORES OF THE HANAOKA MINE, AKITA PREFECTURE (1957)
  • SUDO TOSHIO ID: 9000254356178

    Geological and Mineralogical Institute, Faculty of Science, Tokyo University of Education (1971 from CiNii)

    Articles in CiNii:1

    • CELADONITE IN THE TUFF OF OYA, TOCHIGI PREFECTURE, JAPAN (1971)
  • SUDO TOSHIO ID: 9000254864872

    Geological Institute, Faculty of Science, University of Tokyo. (1953 from CiNii)

    Articles in CiNii:1

    • PARTICLE SHAPE OF A CERTAIN CLAY OF HYDRATED HALLOYSITE, AS REVEALED BY THE ELECTRON MICROSCOPE (1953)
  • SUDO TOSHIO ID: 9000254864911

    Geological and Mineralogical Institute, Faculty of Science, Tokyo University of Education (1956 from CiNii)

    Articles in CiNii:1

    • CHLORITE FROM THE HITACHI MINE, IBARAGI PREFECTURE (1956)
  • SUDO TOSHIO ID: 9000255846021

    Articles in CiNii:1

    • New occurrence and mineralogical properties of iron-sepiolite. (1976)
  • SUDO TOSHIO ID: 9000256492228

    Geological and Mineralogical Institute, Faculty of Science, Tokyo University of Education (1970 from CiNii)

    Articles in CiNii:1

    • 1969 INTERNATIONAL CLAY CONFERENCE, TOKYO (1970)
  • SUDO Toshio ID: 9000000134277

    建設省関東地方建設局宮ケ瀬ダム工事事務所 (1995 from CiNii)

    Articles in CiNii:1

    • DAM CONCRETE FOR MIYAGASE SUBDAM (ISHIGOYA DAM) IS PUMPED BY THE CONCRETE PUMP (1995)
  • SUDO Toshio ID: 9000000252925

    Department of Energy Science and Engineering, Musahi Institue of Technology (2000 from CiNii)

    Articles in CiNii:1

    • Thermal efficiency analysis in a hydrogen premixed combustion engine (2000)
  • SUDO Toshio ID: 9000000597833

    コクド工機(株) 東京工場 (1996 from CiNii)

    Articles in CiNii:1

    • コクド工機(株) 東京工場 (1996)
  • SUDO Toshio ID: 9000001505587

    Association of Super-advanced Electronics Technologies (ASET) Tsukuba Center (2001 from CiNii)

    Articles in CiNii:1

    • Effects of On-Chip Capacitor on Switching Noise and Radiated Emission (2001)
  • SUDO Toshio ID: 9000001664128

    Corporate Manufacturing Engineering Center, Toshiba Corporation (2005 from CiNii)

    Articles in CiNii:1

    • Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance(Printed Circuit Boards, <Special Section>2004 International Symposium on Electromagnetic Compatibility) (2005)
  • SUDO Toshio ID: 9000002845991

    Articles in CiNii:10

    • 高速差動バス配線での製造公差解析 (2005)
    • Perspectives for EMC Design and Recent Topics (1999)
    • Future Perspectives for EMC Design with Electromagnetic Consideration (2000)
  • SUDO Toshio ID: 9000002846335

    Association of Super-Advanced Electronics Technologies (ASET) (2004 from CiNii)

    Articles in CiNii:8

    • LSI搭載プリント版のIO出力動作モードにおける不要輻射に関する考察 (2001)
    • Study on Reduction of Radiated Emission from PCB by Using Test LSI (2002)
    • Relationships between LSI Power Supply Network and Switching Noise and Electromagnetic Radiation (2004)
  • SUDO Toshio ID: 9000002876527

    Corporate Manufacturing Engineering Center, Toshiba Corp. (2006 from CiNii)

    Articles in CiNii:2

    • Intention to the Special Edition (2005)
    • Characterization of Simultaneous Switching Noise and Electromagnetic Radiation Associated with Chip and Package Electrical Properties (2006)
  • SUDO Toshio ID: 9000003084186

    Corporate Manufacturing Engineering Center, Toshiba Corporation (2001 from CiNii)

    Articles in CiNii:10

    • Electrical Properties of Differential Transmission Line and Meander Delay Line (2001)
    • The characterization of simultaneous switching noise by use of test device and electro-magnetic field simulation (1993)
    • Wettability of tin-plated tape carrier package during thermal and humid aging (1993)
  • SUDO Toshio ID: 9000004607325

    Articles in CiNii:9

    • Green or Brown Coloured Chloritic Minerals found in Altered Volcanic Rocks and Pumiceous Tuff (1955)
    • 柴田秀賢先生の逝去を悼む (1981)
    • 討論会特集号の序に代えて (1971)
  • SUDO Toshio ID: 9000004892174

    Toshiba Corporation (2007 from CiNii)

    Articles in CiNii:13

    • Effects of the Board Power/Ground Layer Configuration on Simultaneous Switching Noise (SSN) and EMI (2007)
    • 銅/ポリイミド薄膜配線基板 (プリント配線板<特集>) (1990)
    • EMCテクノロジー 半導体パッケージとEMC設計 (2005)
  • SUDO Toshio ID: 9000004896619

    TOSHIBA Corporation, Semiconductor Device Engineering Laboratory (1996 from CiNii)

    Articles in CiNii:2

    • Future Perspectives for Multi-chip Module Technology (1995)
    • Oxygen influence on barrier metal of solder bumps (1996)
  • SUDO Toshio ID: 9000005336123

    Geological and Mineralogical Institute, Faculty of Science, Tokyo University of Education (1960 from CiNii)

    Articles in CiNii:1

    • COMPLEX CLAY MINERAL MIXTURES OCCURRING IN AMYGDALES OF BASALT (1960)
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