Search Results1-20 of  202

  • Sugano Takuo ID: 9000009564403

    Articles in CiNii:1

    • Single Electron Transistor and Fabrication Technologies (1996)
  • Sugano Takuo ID: 9000016878360

    Articles in CiNii:1

    • ION-SENSITIVE FIELD-EFFECT TRANSISTORS WITH INORGANIC GATE OXIDE FOR PH SENSING (1982)
  • SUGANO TAKUO ID: 9000003423028

    Faculty of Engineering, Toyo University (1992 from CiNii)

    Articles in CiNii:6

    • Exploring Novel Physical Phenomena for Possible Application to Devices (1992)
    • Physical Limitations for Device Performance. (1992)
    • GaAsの熱酸化 (1976)
  • SUGANO TAKUO ID: 9000252776947

    Laboratory for Nano-Electronics Materials, Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN) (1996 from CiNii)

    Articles in CiNii:1

    • Single Electron Transistor and Fabrication Technologies. (1996)
  • SUGANO Takuo ID: 9000000522130

    Faculty of Engineering, The University of Tokyo (1992 from CiNii)

    Articles in CiNii:1

    • -1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress (1992)
  • SUGANO Takuo ID: 9000000985495

    Bio-nanoelectronics Research Center, Toyo University (2003 from CiNii)

    Articles in CiNii:1

    • Characterization of Trap States at Silicon-On Insulator (SOI)/Buried Oxide (BOX) Interface by Back Gate Transconductance Characteristics in SOI MOSFETs (2003)
  • SUGANO Takuo ID: 9000002343408

    Articles in CiNii:1

    • Bridge Type Josephson Junction Devices and Integrated Circuits (1986)
  • SUGANO Takuo ID: 9000003356805

    Nanoelectronic Materials Laboratory, Frontier Research Program, RIKEN (1999 from CiNii)

    Articles in CiNii:24

    • Single Electron Device with Asymmetric Tunnel Barriers (1996)
    • Characterization of Small Superconducting Rings and Its Possible Application to New Single Flux Quantum Devices (1998)
    • Carrier Transport in Nanoscale Structures (1996)
  • SUGANO Takuo ID: 9000005522500

    Department of Electronic Engineering, Faculty of Engineering, University of Tokyo (1971 from CiNii)

    Articles in CiNii:1

    • Galvanomagnetic Effects in Silicon Surface Inversion Layers (1971)
  • SUGANO Takuo ID: 9000005523604

    Department of Electronics Engineering, University of Tokyo (1970 from CiNii)

    Articles in CiNii:1

    • Forward Characteristics of Si Schottky Diodes (1970)
  • SUGANO Takuo ID: 9000005529531

    Departments of Electrical and Electronic Engineering, Faculty of Engineering, University of Tokyo (1976 from CiNii)

    Articles in CiNii:1

    • Optical Properties of Vacuum-Deposited CdCr_2Se_4 Thin Film (1976)
  • SUGANO Takuo ID: 9000005529809

    Department of Electronics Engineering, Faculty of Engineering, the University of Tokyo (1976 from CiNii)

    Articles in CiNii:1

    • Scattering of Electrons by Potential Clusters in Ternary Alloy Semiconductor (1976)
  • SUGANO Takuo ID: 9000005530757

    Department of Electronic Engineering, Faculty of Engineering, The University of Tokyo (1976 from CiNii)

    Articles in CiNii:1

    • Studies on Chemically Etched Silicon, Gallium Arsenide, and Gallium Phosphide Surfaces by Auger Electron Spectroscopy (1976)
  • SUGANO Takuo ID: 9000005536214

    Department of Electronic Engineering, Faculty of Engineering, University of Tokyo (1966 from CiNii)

    Articles in CiNii:1

    • Epitaxial Growth of SiC Film on Silicon Substrate and Its Crystal Structure (1966)
  • SUGANO Takuo ID: 9000005538185

    Department of Electronics, Faculty of Engineering, University of Tokyo (1968 from CiNii)

    Articles in CiNii:1

    • Hall Mobility of Electrons in Silicon Surface Inversion Layers (1968)
  • SUGANO Takuo ID: 9000005657629

    Laboratory for Nano-Electronics Materials, Frontier Materials Research Program, The Institute of Physical and Chemical Research (RIKEN) (1995 from CiNii)

    Articles in CiNii:1

    • Effects of Sulfide Treatment on InP Metal-Insulator-Semiconductor Devices with Photochemical Vapor Deposit P_3N_5 Gate Insulators (1995)
  • SUGANO Takuo ID: 9000005730906

    Departments of Electrical and Electronic Engineering, Faculty of Engineering, the University of Tokyo (1976 from CiNii)

    Articles in CiNii:1

    • Mobility of Magnetic Domain Wall of Strip Domain in Garnet Crystal : Computer Simulation and Measurement : B-2: BUBBLE DEVICES (II) (1976)
  • SUGANO Takuo ID: 9000005731027

    Department of Electronic Engineering, the University of Tokyo (1976 from CiNii)

    Articles in CiNii:1

    • Physical and Technological Limits in Size of Semiconductor Devices : E-2: PHYSICAL AND TECHNOLOGICAL LIMITS OF HIGH-DENSITY INTERGRATION (1976)
  • SUGANO Takuo ID: 9000005732236

    Department of Electronic Engineering, Faculth of Engineering the University of Tokyo (1979 from CiNii)

    Articles in CiNii:1

    • Deep Level Transient Spectroscopy of Bulk Traps and Interface States in Si MOS Diodes (1979)
  • SUGANO Takuo ID: 9000005737129

    RIKEN (The Institute of Physical and Chemical Research) (1995 from CiNii)

    Articles in CiNii:1

    • Path Integral Technique for Inter-Landau Level Tunneling (1995)
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