Search Results1-20 of  79

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  • SUGAWARA Minoru ID: 1000050008504

    群馬大学 (2009 from CiNii)

    Articles in CiNii:94

    • Existence and its Physical Sustaining Mechanism of a Glow Discharge Generated by Narrow-Spaced Two Parallel-Cathodes (1995)
    • Compensation of R. F. Potential Variation and its Optimization for a Probe Measurement in R. F. Discharge Plasmas (1995)
    • Study of the Transition from Ambipolar to Free Diffusion by means of Afterglow Technique (1997)
  • SUGAWARA Minoru ID: 9000000664353

    石野ガスケット工業(株) (1992 from CiNii)

    Articles in CiNii:1

    • Flatness Improvement in Beading of Thin Hard Metal Sheet (1992)
  • SUGAWARA Minoru ID: 9000002208656

    INSTITUTE OF PLASMA PHYSICS NAGOYA UNIVERSITY (1963 from CiNii)

    Articles in CiNii:1

    • <RESEARCH REPORT>Langmuir Probe Method for a Plasma Having Small Amplitude Qscillations (1963)
  • SUGAWARA Minoru ID: 9000002208724

    Research Information center, Institute of Plasma Physics, Nagoya University:Permanently at Technical Laboratory, Central Research Institute of Electric Power Industry (1965 from CiNii)

    Articles in CiNii:1

    • Effects of a Magnetic Field on Electron Probe Currents (1965)
  • SUGAWARA Minoru ID: 9000003340920

    Department of Electronic Engineering, Faculity of Engineering, Tohoku University:(present) Technical Laboratory, Central Research Institute of Electric Power Industry (1964 from CiNii)

    Articles in CiNii:1

    • Langmuir Probe Method for a Plasma Having Small Amplitude Oscillations (1964)
  • SUGAWARA Minoru ID: 9000003345676

    AGENE Research Institute (1996 from CiNii)

    Articles in CiNii:1

    • ESTIMATION OF THE PHYSICAL DISTANCE BETWEEN MAJOR GENOMIC MARKERS IN THE WERNER SYNDROME LOCUS (8p11.2-12) BY DUAL-COLOR FISH ANALYSIS (1996)
  • SUGAWARA Minoru ID: 9000005671962

    Hachinohe Institute of Technology (1996 from CiNii)

    Articles in CiNii:1

    • Measurements of the Time-Averaged Sheath Drop Using the Gridded Energy Analyzer (1996)
  • SUGAWARA Minoru ID: 9000005733590

    MOS LSI Division, Sony Corporation (1995 from CiNii)

    Articles in CiNii:1

    • Experimental Verification of an Aerial Image Evaluation Method and Its Application to Studies of Attenuated Phase-Shifting Masks (1995)
  • SUGAWARA Minoru ID: 9000005844393

    ASET EUV Laboratory (2002 from CiNii)

    Articles in CiNii:3

    • Approach to Patterning of Extreme Ultraviolet Lithography Masks using Ru Buffer Layer (2001)
    • Modeling of In-Plane Distortion of Extreme Ultraviolet Lithography Mask in Flat State (2002)
    • Assessment of Heat Deformation and Throughput for Selecting Mask Substrate Material for Extreme Ultraviolet Lithography (2002)
  • SUGAWARA Minoru ID: 9000006695814

    鳥取大学 (1986 from CiNii)

    Articles in CiNii:2

    • An Essay on "Habugaoka (Hill of Habu)", Monthly Journal of Children's Composition Issued by Aida Elementary School in Hyogo Prefecture: Focusing on the Efforts of ToI Yoshio (note: an elementary school teacher in Hyogo) to Enlighten Children's Parents through Poetry Education (1977)
    • Historical Study of Teaching Practice for Composition in the Post-War Period: Children's Poetry Education in the Hyogo Group for Children's Composition and Journal of Children's Poetry "kirin (giraffe) (1986)
  • SUGAWARA Minoru ID: 9000107348853

    ASET EUV Laboratory (2003 from CiNii)

    Articles in CiNii:1

    • Estimation of Mask Placement Error Caused by Multilayer Stress Profile (2003)
  • SUGAWARA Minoru ID: 9000107349246

    ASET (Association of Super-Advanced Electronics Technologies), EUV Process Technology Research Laboratory (2003 from CiNii)

    Articles in CiNii:1

    • Pattern Printability for Variation in Thickness of a Mo/Si Mask Blank in Extreme Ultraviolet Lithography (2003)
  • SUGAWARA Minoru ID: 9000107351040

    Association of Super-Advanced Electronic Technologies, EUV Process Technology Research Laboratory (2007 from CiNii)

    Articles in CiNii:1

    • Impact of Slanted Absorber Side Walls on Critical Dimension Error in Extreme Ultraviolet Lithography (2007)
  • SUGAWARA Minoru ID: 9000107356377

    Association of Super-Advanced Electronics Technologies (ASET) EUVL Laboratory (2003 from CiNii)

    Articles in CiNii:1

    • Design of Phase-Shift Masks in Extreme Ultraviolet Lithography (2003)
  • SUGAWARA Minoru ID: 9000107366545

    Association of Super-Advanced Electronic Technologies, EUV Process Technology Research Laboratory, c/o NTT Atsugi R&D Center (2005 from CiNii)

    Articles in CiNii:1

    • Analysis of Asymmetry of Printed Image by Off-Axis Incident Light onto Reflective Mask in Extreme Ultraviolet Lithography (2005)
  • SUGAWARA Minoru ID: 9000107374937

    Association of Super-Advanced Electronic Technologies, EUV Process Technology Research Laboratory, c/o NTT Atsugi R&D Center (2005 from CiNii)

    Articles in CiNii:1

    • Mask Pattern Correction by Energy Loss Compensation in Extreme Ultraviolet Lithography (2005)
  • SUGAWARA Minoru ID: 9000107377401

    EUV Process Technology Research Laboratory, Association of Super-Advanced Electronics Technologies (ASET) (2003 from CiNii)

    Articles in CiNii:1

    • Alternating Phase Shift Mask in Extreme Ultra Violet Lithography (2003)
  • SUGAWARA Minoru ID: 9000107377813

    ASET EUV Process Technology Laboratory (2003 from CiNii)

    Articles in CiNii:1

    • Heat Sink Dependency of Mask In-Plane Displacement for Extreme Ultraviolet Lithography (2003)
  • SUGAWARA Minoru ID: 9000107382973

    Department of Electrical Engineering, Hachinohe Institute of Technology (1996 from CiNii)

    Articles in CiNii:1

    • Monte Carlo Simulation of RF Plasmas and Trial Investigation of Similarity Rule (1996)
  • SUGAWARA Minoru ID: 9000256339879

    The First Department of Surgery, Tokyo Medical and Dental University (1992 from CiNii)

    Articles in CiNii:1

    • A CASE OF TYPE-IIc EARLY GASTRIC CARCINOMA IN FUNDIC GLAND MUCOSAE MAKING A CHANGE OF ENDOSCOPIC FINDINGS IN A SHORT PERIOD (1992)
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