Search Results1-20 of  134

  • SUGAWARA Yasuhiro ID: 1000040206404

    Superconductivity Research Laboratory, International Superconductivity Technology Center (2009 from CiNii)

    Articles in CiNii:119

    • Atomic Resolution Imaging of Compound Semiconductor Surface with Non-contact UHV-AFM (1995)
    • Atomic Resolution Imaging Orbital Hybridization with Noncontact Atomic Force Microsopy (AFM)* (1998)
    • Present and Prospect for Non-contact Mode Atomic Force Microscopy. (1997)
  • SUGAWARA Yasuhiro ID: 9000005561211

    Central Research Laboratory, Hitachi Ltd. (1994 from CiNii)

    Articles in CiNii:1

    • The Study of Ultrathin Tantalum Oxide Films before and after Annealing with X-Ray Photoelectron Spectroscopy (1994)
  • SUGAWARA Yasuhiro ID: 9000005755343

    Deparment of Electrical Engineering, Faculty of Engineering, Tohoku University (1986 from CiNii)

    Articles in CiNii:1

    • Off-Centric Concave Transducer for Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing (1986)
  • SUGAWARA Yasuhiro ID: 9000006373221

    Department of Applied Physics, Graduate School of Engineering, Osaka University (2007 from CiNii)

    Articles in CiNii:1

    • Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip-Surface Interaction (2007)
  • SUGAWARA Yasuhiro ID: 9000018699247

    Department of Geodesy, Geospatial Information Authority of Japan (2010 from CiNii)

    Articles in CiNii:1

    • Gravity changes observed between 2004 and 2009 near the Tokai slow-slip area and prospects for detecting fluid flow during future slow-slip events (2010)
  • SUGAWARA Yasuhiro ID: 9000020888488

    School of Food, Agricultural and Environmental Sciences, Miyagi University (2011 from CiNii)

    Articles in CiNii:1

    • Th2 Immune Responses and Alternatively Activated Macrophages (AAMacs) in Helminth Infection in Aged Mice (2011)
  • SUGAWARA Yasuhiro ID: 9000107353671

    Department of Applied Physics, Graduate School of Engineering, Osaka University (2010 from CiNii)

    Articles in CiNii:1

    • Effect of Surface Stress around the S_A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5K (2010)
  • SUGAWARA Yasuhiro ID: 9000107355917

    Department of ELectronic Engineering, Faculty of Engineering, Osaka University (1997 from CiNii)

    Articles in CiNii:1

    • Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air (1997)
  • SUGAWARA Yasuhiro ID: 9000107374508

    Articles in CiNii:1

    • (Ga, Mn)As/GaAs Diluted Magnetic Semiconductor Superlattice Structures Prepared by Molecular Beam Epitaxy (1997)
  • SUGAWARA Yasuhiro ID: 9000107389802

    Department of Applied Physics, Osaka University (2003 from CiNii)

    Articles in CiNii:1

    • The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping (2003)
  • SUGAWARA Yasuhiro ID: 9000253326260

    Department of Physics, Faculty of Science, Hiroshima University (1995 from CiNii)

    Articles in CiNii:1

    • Atomic resolution image of cleaved surface of compound semiconductors observed with ultrahigh-vacuum atomic force microscope in contact and noncontact modes (1995)
  • SUGAWARA Yasuhiro ID: 9000253326912

    Department of Electronic Engineering, Graduate School of Engineering, Osaka University. (1998 from CiNii)

    Articles in CiNii:1

    • (2) Noncontact atomic force microscopy with ultimate spatial-resolution (1998)
  • SUGAWARA Yasuhiro ID: 9000253648770

    Department of Physics, Faculty of Science, Hiroshima University (1996 from CiNii)

    Articles in CiNii:1

    • Frictional Force Microscopy. Explanation of Microscopic Frictional Force.:Explanation of Microscopic Frictional Force (1996)
  • SUGAWARA Yasuhiro ID: 9000253648782

    Department of Physics, Faculty of Science, Hiroshima University (1996 from CiNii)

    Articles in CiNii:1

    • How to Obtain High Resolution Images in Atomospheric-and UHV-AFMs:The Know-how for the Construction of AFM and Image Interpretation (1996)
  • SUGAWARA Yasuhiro ID: 9000253648796

    Laboratory of Crystal Physics, Faculty of Science, Hiroshima University|Department of Physics, Faculty of Science, Hiroshima University (1996 from CiNii)

    Articles in CiNii:1

    • How to Obtain High Resolution Images in Atomospheric-and UHV-AFMs:The Know-how for the Construction of AFM and Image Interpretation (1996)
  • Sugawara Yasuhiro ID: 9000050197216

    Articles in CiNii:1

    • Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy (2008)
  • Sugawara Yasuhiro ID: 9000067300865

    Articles in CiNii:1

    • Force Mapping of the NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K (2012)
  • Sugawara Yasuhiro ID: 9000081985524

    Articles in CiNii:1

    • High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation (2008)
  • Sugawara Yasuhiro ID: 9000237751659

    Dept. of Appl. Phys. Graduate School of Engineering, Osaka Univ. (2012 from CiNii)

    Articles in CiNii:1

    • 24pCC-2 Force distribution measurement on Cu(110)-O surface with non-contact atomic force microscopy (2012)
  • Sugawara Yasuhiro ID: 9000252762361

    Department of Electronic Engineering, Faculty of Engineering, Iwate University (1990 from CiNii)

    Articles in CiNii:1

    • Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM) (1990)
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