Search Results1-5 of  5

  • SUZUKI Kaina ID: 9000001721925

    Process development division C850, Fujitsu Limited (1995 from CiNii)

    Articles in CiNii:1

    • Thickness-Deconvolved Structural Properties of Thermally Grown Silicon Dioxide Film (1995)
  • SUZUKI Kaina ID: 9000004838730

    Semiconductor Leading Edge Technologies,Inc. (2003 from CiNii)

    Articles in CiNii:1

    • Statistical Threshold Voltage Fluctuation Analysis by Monte Carlo Ion Implantation Method (2003)
  • SUZUKI Kaina ID: 9000004954683

    Fujitsu Semiconductor (2011 from CiNii)

    Articles in CiNii:3

    • Oxidation Simulation in 3D Process Simulator HySyProS (2001)
    • Oxidation Simulation in 3D Process Simulator HySyProS (2001)
    • Device Simulation of STM Carrier Profiling (2011)
  • SUZUKI Kaina ID: 9000107315430

    Fujitsu Semiconductor (2011 from CiNii)

    Articles in CiNii:1

    • Device Simulation of STM Carrier Profiling (2011)
  • Suzuki Kaina ID: 9000402013503

    Articles in CiNii:1

    • 2013-04-01 (2013)
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