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  • SAI Akihisa ID: 9000016378786

    Department of Engineering, Toyota Technological Institute (2009 from CiNii)

    Articles in CiNii:1

    • In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms (2009)
  • Sai Akihisa ID: 9000401566820

    Articles in CiNii:1

    • In situReal-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms (2009)
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