Search Results1-20 of  47

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  • SAKAMOTO Toshitsugu ID: 9000404507592

    Fundamental Research Laboratories, NEC Corporation (2003 from CiNii)

    Articles in CiNii:1

    • DNA separation using nanobiochip technology (2003)
  • SAKAMOTO Toshitsugu ID: 9000404508567

    Fundamental & Environmental Research Labs., NEC Corp|Japan Science and Technology Agency (2006 from CiNii)

    Articles in CiNii:1

    • Solid electrolyte memory (2006)
  • Sakamoto Toshitsugu ID: 9000018505757

    Articles in CiNii:1

    • ON-state reliability of solid-electrolyte switch under pulsed alternating current stress for programmable logic device (2011)
  • Sakamoto Toshitsugu ID: 9000403976122

    Articles in CiNii:1

    • Single-Event Effects Induced on Atom Switch-based Field-Programmable Gate Array (2019)
  • SAKAMOTO Toshitsugu ID: 9000004824862

    The authors are with the System Devices and Fundamental Research, NEC Corporation (2001 from CiNii)

    Articles in CiNii:1

    • Electrical Transport in Nano-Scale Silicon Devices (2001)
  • SAKAMOTO Toshitsugu ID: 9000005737798

    Fundamental Research Laboratories, NEC Corporation (1995 from CiNii)

    Articles in CiNii:1

    • Study of Josephson-Quasiparticle Cycles in Superconducting Single-Electron Transistors (1995)
  • SAKAMOTO Toshitsugu ID: 9000006838097

    Device Platforms Research Laboratories, NEC Corporation:Japan Science and Technology Agency (2008 from CiNii)

    Articles in CiNii:4

    • Switching Property of Atomic Switch Controlled by Solid Electrochemical Reaction (2006)
    • A Ta_2O_5 Solid-electrolyte Switch with Improved Reliability (2008)
    • A Ta_2O_5 Solid-electrolyte Switch with Improved Reliability (2008)
  • SAKAMOTO Toshitsugu ID: 9000046171263

    Fundamental Research Laboratories, NEC Corporation (2002 from CiNii)

    Articles in CiNii:1

    • Multiple-Valued Memory Operation Using a Single-Electron Device : a Proposal and an Experimental Demonstration of a Ten-Valued Operation (2002)
  • SAKAMOTO Toshitsugu ID: 9000253325979

    NEC Fundamental Research Laboratories. (1994 from CiNii)

    Articles in CiNii:1

    • Single electronics:A technology enabling the control of individual electrons (1994)
  • SAKAMOTO Toshitsugu ID: 9000404345261

    System Platform Research Laboratories, NEC Corporation (2019 from CiNii)

    Articles in CiNii:1

    • A Cu atom switch fabricated with an advanced CMOS technology (2019)
  • Sakamoto Toshitsugu ID: 9000025097090

    Articles in CiNii:1

    • Effect of Ion Diffusion on Switching Voltage of Solid-Electrolyte Nanometer Switch (Special Issue: Solid State Devices & Materials) (2006)
  • Sakamoto Toshitsugu ID: 9000252979702

    Department of Electrical Engineering, Osaka University (1991 from CiNii)

    Articles in CiNii:1

    • Electron Focusing in a Widely Tapered Cross Junction (1991)
  • Sakamoto Toshitsugu ID: 9000258124055

    NEC Fundamental Research Laboratories, 34 Miyukigaoka, Tsukuba, Ibaraki 305 (1994 from CiNii)

    Articles in CiNii:1

    • Coulomb Blockade of Two Quantum Dots in Series. (1994)
  • Sakamoto Toshitsugu ID: 9000258124440

    Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Single Electron Digital Phase Modulator. (1995)
  • Sakamoto Toshitsugu ID: 9000258129141

    Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Observation of 77K Staircase I-V Characteristics in 2DEG's Irradiated by a Focused Ion Beam. (1995)
  • Sakamoto Toshitsugu ID: 9000258129203

    Fundamental Research Laboratories, NEC Corporation, 34, Miyukigaoka, Tsukuba, Ibaraki 305, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Study of Josephson-Quasiparticle Cycles in Superconducting Single-Electron Transistors. (1995)
  • Sakamoto Toshitsugu ID: 9000258134608

    Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba 305, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Calixcarene Electron Beam Resist for Nano-Lithography. (1997)
  • Sakamoto Toshitsugu ID: 9000258136025

    Fundamental Research Laboratories, NEC Corporation, 34, Miyukigaoka, Tsukuba, Ibaraki 305, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Proposal of Pseudo Source and Drain MOSFETs for Evaluating 10-nm Gate MOSFETs. (1997)
  • Sakamoto Toshitsugu ID: 9000258136228

    NEC Fundamental Research Laboratories, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Spatial Distributions of Individual Traps in a Si/SiO2 Interface. (1997)
  • Sakamoto Toshitsugu ID: 9000258162559

    NEC Fundamental Research Laboratories, 34 Miyukigaoka, Tsukuba, 305-8501, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Structure and Resonant Characteristics of Amorphous Carbon Pillars Grown by Focused-Ion-Beam-Induced Chemical Vapor Deposition. (2002)
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