Search Results1-16 of  16

  • Hitoshi Ohsaki Hirofumi Sakane and Kenichi Handa ID: 9000326649078

    国立研究開発法人 産業技術総合研究所 (2015 from CiNii)

    Articles in CiNii:1

    • Cybersecurity Requirements and the Cerfitfication of Smart-Meter Systems (2015)
  • SAKANE Hitoshi ID: 9000001357001

    Tokai Works, Japan Nuclear Cycle Development Institute (2005 from CiNii)

    Articles in CiNii:1

    • Measurement of Neutron Capture Cross Section of ^<237>Np from 0.02 to 100eV (2005)
  • SAKANE Hitoshi ID: 9000002103399

    Graduate School of Engineering, Nagoya University (2008 from CiNii)

    Articles in CiNii:1

    • Precise Intensity Measurements in the ^<14>N(n, γ)^<15>N Reaction as a γ-Ray Intensity Standard up to 11MeV (2008)
  • SAKANE Hitoshi ID: 9000259594272

    S.H.I. Examination & Inspection, Ltd. (2014 from CiNii)

    Articles in CiNii:1

    • Electromagnetic Simulation of High Resistance Silicon Substrate by Helium ion Irradiation (2014)
  • SAKANE Hitoshi ID: 9000259867196

    S.H.I. Examination & Inspection, Ltd. (2014 from CiNii)

    Articles in CiNii:1

    • Electromagnetic Simulation of High Resistance Silicon Substrate by Helium ion Irradiation (2014)
  • SAKANE Hitoshi ID: 9000261699264

    S.H.I. Examination & Inspection, Ltd. (2014 from CiNii)

    Articles in CiNii:1

    • Electromagnetic Simulation of High Resistance Silicon Substrate by Helium ion Irradiation (2014)
  • SAKANE Hitoshi ID: 9000261699529

    S.H.I. Examination & Inspection, Ltd. (2014 from CiNii)

    Articles in CiNii:1

    • Electromagnetic Simulation of High Resistance Silicon Substrate by Helium ion Irradiation (2014)
  • SAKANE Hitoshi ID: 9000286625428

    S.H.I. Examination & Inspection, Ltd. (2015 from CiNii)

    Articles in CiNii:1

    • A 60-GHz CMOS Transmitter with Gain-Enhanced On-Chip Antenna for Short-Range Wireless Interconnections (2015)
  • SAKANE Hitoshi ID: 9000290371742

    S.H.I. Examination & Inspection, Ltd. (2014 from CiNii)

    Articles in CiNii:1

    • Electromagnetic Simulation of High Resistance Silicon Substrate by Helium ion Irradiation (2014)
  • SAKANE Hitoshi ID: 9000392063635

    JNC (2003 from CiNii)

    Articles in CiNii:1

    • Self-Shielding and Multiple Scattering Corrections for Neutron Capture Cross Section Measurements in Resonance Energy Range (2003)
  • Sakane HItoshi ID: 9000258301404

    Japan Nuclear Cycle Development Institute (2004 from CiNii)

    Articles in CiNii:1

    • An optimization for neutron capture cross section measurement facility (2004)
  • Sakane Hitoshi ID: 9000258301537

    JNC (2004 from CiNii)

    Articles in CiNii:1

    • A design of neutron shield with a collimator of inverted cone shape (2004)
  • Sakane Hitoshi ID: 9000280299022

    住重試験検査株式会社 (2014 from CiNii)

    Articles in CiNii:1

    • C-15-9 Electromagnetic Simulation of CMOS On-Chip Spiral Inductor in 5 GHz band (2014)
  • Sakane Hitoshi ID: 9000311486415

    住重試験検査株式会社 (2015 from CiNii)

    Articles in CiNii:1

    • C-15-15 Analysis of 60 GHz CMOS On-Chip Antenna with 50 % Radiation Efficiency By Helium-3 Ion Irradiation (2015)
  • Sakane Hitoshi ID: 9000392076446

    Japan Nuclear Cycle development Institute (2004 from CiNii)

    Articles in CiNii:1

    • A design of pair-spectrometer for measurement of neutron capture cross sections using prompt gamma-ray spectroscopy (2004)
  • Sakane Hitoshi ID: 9000392080116

    Japan Nuclear Cycle Development Institute (2004 from CiNii)

    Articles in CiNii:1

    • Neutron Capture Cross Section of 237Np (2004)
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