Search Results181-197 of  197

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  • Shimizu Hirofumi ID: 9000401730228

    Articles in CiNii:1

    • 2004-10-08 (2004)
  • Shimizu Hirofumi ID: 9000401737512

    Articles in CiNii:1

    • Behavior of Metal-Induced Negative Oxide Charges on the Surface of N-type Silicon Wafers Using Frequency-Dependent AC Surface Photovoltage Measurements (2005)
  • Shimizu Hirofumi ID: 9000401742081

    Articles in CiNii:1

    • Kinetics of Ultrathin Thermal Oxide Growth on Si(001) Surfaces (2005)
  • Shimizu Hirofumi ID: 9000401760372

    Articles in CiNii:1

    • 2007-07-04 (2007)
  • Shimizu Hirofumi ID: 9000401783121

    Articles in CiNii:1

    • 2009-10-20 (2009)
  • Shimizu Hirofumi ID: 9000401785719

    Articles in CiNii:1

    • Negative Oxide Charge in Thermally Oxidized Cr-Contaminated n-Type Silicon Wafers (2010)
  • Shimizu Hirofumi ID: 9000401792559

    Articles in CiNii:1

    • 2010-12-20 (2010)
  • Shimizu Hirofumi ID: 9000401801790

    Articles in CiNii:1

    • Anomalous Oxide Charge Variation Identified by Alternating Current Surface Photovoltage Method in Cr-Aqueous-Solution-Rinsed p-Type Si(001) Wafers Exposed to Air (2011)
  • Shimizu Hirofumi ID: 9000401807197

    Articles in CiNii:1

    • Erratum: "Schottky-Barrier-Induced AC Surface Photovoltages in Au-Precipitated n-Type Si(001) Surfaces" (2012)
  • Shimizu Hirofumi ID: 9000401828233

    The Research Institute for Iron, Steel and Other Metals, Tohoku University (1970 from CiNii)

    Articles in CiNii:1

    • Anisotropy in the Hardness on (111) and (\bar1\bar1\bar1) Surfaces in InSb (1970)
  • Shimizu Hirofumi ID: 9000401832367

    The Research Institute for Iron, Steel and Other Metals, Tohoku University (1973 from CiNii)

    Articles in CiNii:1

    • Dislocation Loops in an InSb Crystal (1973)
  • Shimizu Hirofumi ID: 9000401900570

    Department of Chemistry, University of Houston, Houston, TX 77204, U.S.A. (2007 from CiNii)

    Articles in CiNii:1

    • Normal Mode Analysis of Polytheonamide B (2007)
  • Shimizu Hirofumi ID: 9000401904786

    Articles in CiNii:1

    • Retraction: "Normal Mode Analysis of Polytheonamide B" (2009)
  • Shimizu Hirofumi ID: 9000402006660

    Articles in CiNii:1

    • Translation from Schottky Barrier to Atomic Bridging-Type Surface Photovoltages in Cr-Aqueous-Solution-Rinsed Si(001) Wafers (2012)
  • Shimizu Hirofumi ID: 9000402013099

    Articles in CiNii:1

    • Enhanced and Retarded SiO2Growth on Thermally Oxidized Fe-Contaminated n-Type Si(001) Surfaces (2013)
  • Shimizu Hirofumi ID: 9000402013128

    Articles in CiNii:1

    • Direct Observation of Au Nanoclusters at Au/Si Interface and Enhanced SiO2Growth Due to Catalytic Action by Au in Thermally Oxidized Au-Precipitated n-Type Si(001) Surfaces (2013)
  • Shimizu Hirofumi ID: 9000403163351

    Formerly, Graduate School of Systems and Information Engineering, University of Tsukuba (2014 from CiNii)

    Articles in CiNii:1

    • Evaluation of Tsunami Wave Loads Acting on Walls of Confined-Masonry-Brick and Concrete-Block Houses (2014)
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