Search Results81-100 of  197

  • Shimizu Hirofumi ID: 9000252765485

    Semiconductor Design & Development Center, Hitachi, Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing (1992)
  • Shimizu Hirofumi ID: 9000252765504

    Semiconductor Design and Development Center, Hitachi, Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • Enhanced Growth of Thermal Oxide Due to Impurity Absorption from Adjoining Contaminated Silicon Wafers (1992)
  • Shimizu Hirofumi ID: 9000252828379

    Semiconductor & Integrated Circuits Division, Hitachi, Ltd. (1994 from CiNii)

    Articles in CiNii:1

    • Nondestructive Characterization of Surface Contaminants in Silicon Wafers Using AC Surface Photovoltage Method (1994)
  • Shimizu Hirofumi ID: 9000252945251

    Musashi Works, Hitachi, Ltd. (1978 from CiNii)

    Articles in CiNii:1

    • Formation of a Stacking Fault-Free Region in Thermally Oxidized Silicon (1978)
  • Shimizu Hirofumi ID: 9000252956426

    Kofu Branch, Musashi Works of Hitachi Ltd. (1985 from CiNii)

    Articles in CiNii:1

    • Warpage of Czochralski-Grown Silicon Wafers as Affected by Oxygen Precipitation (1985)
  • Shimizu Hirofumi ID: 9000252964047

    Kofu Branch, Musashi Works of Hitachi Ltd. (1988 from CiNii)

    Articles in CiNii:1

    • Thermal Warpage of Large Diameter Czochralski-Grown Silicon Wafers (1988)
  • Shimizu Hirofumi ID: 9000252964827

    Kofu Branch, Musashi Works of Hitachi Ltd. (1988 from CiNii)

    Articles in CiNii:1

    • Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method (1988)
  • Shimizu Hirofumi ID: 9000252964887

    Kofu Branch, Musashi Works, Hitachi Ltd. (1988 from CiNii)

    Articles in CiNii:1

    • Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method (1988)
  • Shimizu Hirofumi ID: 9000252968906

    Kofu Branch, Musashi Works of Hitachi Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Effects of Dipping in an Aqueous Hydrofluoric Acid Solution before Oxidation on Minority Carrier Lifetimes in p-Type Silicon Wafers (1989)
  • Shimizu Hirofumi ID: 9000252981472

    Semiconductor Design & Development Center, Hitachi, Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • Effect of Aluminum on Ac Surface Photovoltages in Thermally Oxidized n-Type Silicon Wafers (1992)
  • Shimizu Hirofumi ID: 9000252982053

    Semiconductor Design & Development Center, Hitachi, Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • AC Photovoltaic Images of Thermally Oxidized P-Type Silicon Wafers Contaminated with Metals (1992)
  • Shimizu Hirofumi ID: 9000252985809

    Semiconductor Design & Development Center, Hitachi, Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Oxidation-Induced Stacking Faults Dependent on Oxygen Concentration in Czochralski-Grown Silicon Wafers (1993)
  • Shimizu Hirofumi ID: 9000252987375

    Semiconductor Design & Development Center, Hitachi, Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Simplified AC Photovoltaic Measurement of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults (1993)
  • Shimizu Hirofumi ID: 9000252987565

    Semiconductor & Integrated Circuits Division, Hitachi, Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Nondestructive Diagnostic Method Using AC Surface Photovoltage in Silicon Wafers Rinsed with Metal-Contaminated Water Solutions (1993)
  • Shimizu Hirofumi ID: 9000252987579

    Semiconductor & Integrated Circuits Division, Hitachi, Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Characterization of Damaged Layer Using AC Surface Photovoltage in Silicon Wafers (1993)
  • Shimizu Hirofumi ID: 9000253249710

    Semiconductor & Integrated Circuits Division, Hitachi, Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Iron Distribution and Iron-Induced Negative Charge in Thin SiO<SUB>2</SUB> Films on Silicon Wafers (1995)
  • Shimizu Hirofumi ID: 9000253251204

    Semiconductor & Integrated Circuits Division, Hitachi Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Computer Simulation of Stress Induced Dislocation Multiplication in Large-Diameter Silicon Wafer in High-Temperature Device Processing (1997)
  • Shimizu Hirofumi ID: 9000253251474

    Semiconductor & Integrated Circuits Division, Hitachi Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Monitoring of Ultra-Trace Contaminants on Silicon Wafers for ULSI by a Novel Impurity Extraction and AC Surface Photovoltage Methods (1997)
  • Shimizu Hirofumi ID: 9000253568764

    Ishigaki Tropical Station, Seikai National Fisheries Research Institute|Stock Assessment Division, National Research Institute of Fisheries Science (2004 from CiNii)

    Articles in CiNii:1

    • Mass coral settlement on the artificial reefs in Ishigaki Island, Okinawa, Japan:evidence of sexual recruitment in the year following the 1998 bleaching event (2004)
  • Shimizu Hirofumi ID: 9000253657259

    Kasugai Mill, Oji Paper Co., Ltd. (1998 from CiNii)

    Articles in CiNii:1

    • The Development of New Automatic Grade Change Control System of Paper Machine. (1998)
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