Search Results1-14 of  14

  • Shimotsu Teruho ID: 9000005612270

    Articles in CiNii:1

    • Fine Structure of Crack in Yttrium Oxide and Aluminum Oxide Fluxed Silicon Nitride （1985）
  • SHIMOTSU Teruho ID: 9000253324055

    Central Research Laboratory, Hitachi, Ltd. （1987 from CiNii）

    Articles in CiNii:1

    • Observation by High Resolution Electron Microscopy:II. Josephson Junctions （1987）
  • SHIMOTSU Teruho ID: 9000283546618

    Central Research Laboratory, Hitachi, Ltd. （1989 from CiNii）

    Articles in CiNii:1

    • MAGNETIC AND CRYSTALLOGRAPHIC PROPERTIES OF Co-Cr/Ti-ALLOY THIN FILM DISKS （1989）
  • Shimotsu Teruho ID: 9000252760637

    Central Research Laboratory, Hitachi Ltd. （1988 from CiNii）

    Articles in CiNii:1

    • Direct Observation of a-Si:H/a-Si<SUB>1−<I>x</I></SUB>C<I><SUB>x</SUB></I>:H Multilayers and Their Electrical Properties （1988）
  • Shimotsu Teruho ID: 9000252957204

    Central Research Laboratory, Hitachi Ltd. （1985 from CiNii）

    Articles in CiNii:1

    • Microstructure of CoCr Thin Films Prepared by Sputtering （1985）
  • Shimotsu Teruho ID: 9000252958322

    Central Research Laboratory, Hitachi Ltd. （1986 from CiNii）

    Articles in CiNii:1

    • Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods （1986）
  • Shimotsu Teruho ID: 9000392687398

    Articles in CiNii:1

    • Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current （1984）
  • Shimotsu Teruho ID: 9000392700468

    Articles in CiNii:1

    • Microstructure of CoCr Thin Films Prepared by Sputtering （1985）
  • Shimotsu Teruho ID: 9000392704346

    Articles in CiNii:1

    • Direct Observation of a-Si:H/a-Si<SUB>1−<I>x</I></SUB>C<I><SUB>x</SUB></I>:H Multilayers and Their Electrical Properties （1988）
  • Shimotsu Teruho ID: 9000392712820

    Articles in CiNii:1

    • Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods （1986）
  • Shimotsu Teruho ID: 9000401594783

    Articles in CiNii:1

    • Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current （1984）
  • Shimotsu Teruho ID: 9000401598208

    Articles in CiNii:1

    • Microstructure of CoCr Thin Films Prepared by Sputtering （1985）
  • Shimotsu Teruho ID: 9000401598975

    Articles in CiNii:1

    • Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods （1986）
  • Shimotsu Teruho ID: 9000401610046

    Articles in CiNii:1

    • Direct Observation of a-Si:H/a-Si1-xCx:H Multilayers and Their Electrical Properties （1988）
Page Top