Search Results1-9 of  9

  • Shin Hong-Sik ID: 9000018898185

    Articles in CiNii:1

    • Improvement of Thermal Stability of Ni-Germanide with Ni/Co/Ni/TiN Structure for High Performance Ge Metal-Oxide-Semiconductor Field Effect Transistors (Special Issue : Solid State Devices and Materials (1)) (2012)
  • Shin Hong-Sik ID: 9000076644789

    Articles in CiNii:1

    • Influence of Incorporating Rare Earth Metals on the Schottky Barrier Height of Ni Silicide (2010)
  • Shin Hong-Sik ID: 9000401795908

    Articles in CiNii:1

    • 2011-04-20 (2011)
  • Shin Hong-Sik ID: 9000401803625

    Articles in CiNii:1

    • 2012-02-20 (2012)
  • Shin Hong-Sik ID: 9000401996783

    Articles in CiNii:1

    • 2011-04-01 (2011)
  • Shin Hong-Sik ID: 9000402004488

    Articles in CiNii:1

    • 2012-02-01 (2012)
  • Shin Hong-Sik ID: 9000402022413

    Articles in CiNii:1

    • Novel silicon surface passivation by Al2O3/ZnO/Al2O3films deposited by thermal atomic layer deposition (2014)
  • Shin Hong-Sik ID: 9000402025347

    Articles in CiNii:1

    • Effect of surface pretreatment in the thermal atomic layer deposition of Al2O3for passivation of crystal Si solar cells (2014)
  • Shin Hong-Sik ID: 9000402025605

    Articles in CiNii:1

    • Novel Ni silicide formed with a Ni/Er/Ni/TiN structure for thermal stable and low contact resistance source/drain in MOSFETs (2014)
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