Search Results1-8 of  8

  • SHIRAI KIYOSHI ID: 9000254948572

    First Department of Oral and Maxillofacial Surgery, School of Dentistry, Tsurumi University (1984 from CiNii)

    Articles in CiNii:1

    • Clinical evaluation of CS-600 (Loxoprofen sodium) on postexodontic pain. A multi-clinic double-blind study.:—A multi-clinic double-blind study— (1984)
  • SHIRAI Kiyoshi ID: 9000002168672

    Semiconductor Leading Edge Technologies, Inc. (Selete) (2005 from CiNii)

    Articles in CiNii:1

    • Extendibility of High Mobility HfSiON Gate Dielectrics (2005)
  • SHIRAI Kiyoshi ID: 9000003804687

    Nippon Institute of Technology (2001 from CiNii)

    Articles in CiNii:1

    • 611 Fabrication of an In-pipe Mobile Robot Driven by 3 Gas-liquid Phase-change type actuators (2001)
  • SHIRAI Kiyoshi ID: 9000255825160

    東京工業試験所 (1968 from CiNii)

    Articles in CiNii:1

    • Ammoxidationo f <I>p</I>-Xylene over Binary Catalysts (1968)
  • SHIRAI Kiyoshi ID: 9000255904041

    National Research Institute for Metals (1972 from CiNii)

    Articles in CiNii:1

    • Transparency Factor for X-ray Diffractometry (1972)
  • Shirai Kiyoshi ID: 9000002650969

    成蹊大学工学部 (1970 from CiNii)

    Articles in CiNii:1

    • <Short Notes> Studies on refractory fibers and whiskers reinforced composites(Part 6) -Tensile and fatigue strength of composites made from carbon and asbestos cloth-Thermosetting resin systems- (1970)
  • Shirai Kiyoshi ID: 9000025064248

    Articles in CiNii:1

    • Hole mobility enhancement caused by gate-induced vertical strain in gate-first full-metal high-k p-channel field effect transistors using ion-beam W (2009)
  • Shirai Kiyoshi ID: 9000025096462

    Articles in CiNii:1

    • Fabrication of High-Mobility Nitrided Hafnium Silicate Gate Dielectrics with Sub-1-nm Equivalent Oxide Thickness Using Plasma Nitridation and High-Temperature Postnitridation Annealing (Special Issue: Solid State Devices & Materials) (2006)
Page Top