Search Results1-20 of  61

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  • Katsuhisa SHIRAKI Huimei LU Yoshimasa ISHIMURA Shoji KASHIWABARA ToshihiroUESAKA Osamu KATOH and Hiromitsu WATANABE ID: 9000002202836

    Department of Cellular Biology, Research Institute for Radiation Biology andMedicine, Hiroshima University, Hiroshima 734-8553, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Effects of Weaning by Surrogate Mothers (ACI) on Tumor Development in SD Rats Treatedwith Methylnitrosourea (MNU) and/or N-Methyl-N-nitro-N-nitrosoguanidine (MNNG) (2002)
  • SHIRAKI HIROMITSU ID: 9000005310161

    Central Research Laboratories, Nippon Electric Company, Ltd. (1980 from CiNii)

    Articles in CiNii:1

    • State of Art of Solid State Image Sensor : Some consideration on CCD linear image sensor application to telescine (1980)
  • SHIRAKI Hiromitsu ID: 9000000008968

    NEC Corporation (1995 from CiNii)

    Articles in CiNii:3

    • Characteristics of a Current Amplifying Image Sensor with Buried Electrodes (1994)
    • The Characteristics of a Buried Electrode Image Sensor with Photo-Electric Conversion Area Connected to a Common Drain (1995)
    • Discussion on a Source Follower Type Image Sensor Driven from Back Electrodes (1995)
  • SHIRAKI Hiromitsu ID: 9000005298077

    Faculty of Engineering, Ibaraki University (2003 from CiNii)

    Articles in CiNii:1

    • An Improved CCD Register Driven from Overflow Drain through Barrier (2003)
  • SHIRAKI Hiromitsu ID: 9000005523038

    Central Research Laboratories, Nippon Electric Co., Ltd. (1971 from CiNii)

    Articles in CiNii:1

    • Bright Spots in the Image of Silicon Vidicon (1971)
  • SHIRAKI Hiromitsu ID: 9000005526231

    Central Research Laboratories, Nippon Electric Company (1974 from CiNii)

    Articles in CiNii:1

    • Silicon Wafer Annealing Effect in Loop Defect Generation (1974)
  • SHIRAKI Hiromitsu ID: 9000005528726

    Central Research Laboratories, Nippon Electric Company (1975 from CiNii)

    Articles in CiNii:1

    • Elimination of Stacking Faults in Silicon Wafers by HCl Added Dry O_2 Oxidation (1975)
  • SHIRAKI Hiromitsu ID: 9000005730983

    Central Research Laboratories, Nippon Electric Co., Ltd. (1976 from CiNii)

    Articles in CiNii:1

    • 228 by 248 Cell Charge-Coupled Image Sensor with Two-Level Overlapping Poly-Silicon Electrodes : B-4: IMAGING DEVICES (1976)
  • SHIRAKI Hiromitsu ID: 9000253321922

    Central Research Laboratories, Nippon Electric Co., Ltd. (1980 from CiNii)

    Articles in CiNii:1

    • CCD Image Sensor (1980)
  • SHIRAKI Hiromitsu ID: 9000253323321

    Nippon Electric Corporation. (1985 from CiNii)

    Articles in CiNii:1

    • Recent Progress in Solid State Image Sensors (1985)
  • Shiraki Hiromitsu ID: 1000050272109

    Department of Systems Engineering, Faculty of Engineering, Ibaraki University (2004 from CiNii)

    Articles in CiNii:30

    • A Discussion on the Relation between Substrate Impurity Concentration Fluctuation and Saturated Signal Fluctuation in the Charge Coupled Device Image Sensors (1999)
    • A Nonlinearity Consideration on Photoelectric Conversion Characteristics in CCD Image Sensor (1999)
    • Principle and Simulation for Reconstruction of Two-dimensional Image beyond Nyquist (2000)
  • Shiraki Hiromitsu ID: 9000006160883

    NEC Corporation (1994 from CiNii)

    Articles in CiNii:1

    • An Operation Analisis of Vertical Overflow Drain (1994)
  • Shiraki Hiromitsu ID: 9000018313270

    Faculty of Engineering, Ibaraki University (1997 from CiNii)

    Articles in CiNii:1

    • A Consideration on Signal Charge Increase in the Photodides with VOD Structure. (1997)
  • Shiraki Hiromitsu ID: 9000019973891

    Articles in CiNii:1

    • A Traveling-Wave Tube with a Photo-Cathode for Use as the Demodulator in Laser Communications (1964)
  • Shiraki Hiromitsu ID: 9000021727971

    Articles in CiNii:1

    • An Operation Analysis Method for Vertical Overflow Drain. (1994)
  • Shiraki Hiromitsu ID: 9000021734566

    Articles in CiNii:1

    • Amplifing Image Sensor with Buried Electrode. (1994)
  • Shiraki Hiromitsu ID: 9000252755457

    Central Research Laboratories, Nippon Electric Company (1974 from CiNii)

    Articles in CiNii:1

    • Image Damages Due to the Lattice Defects in the Silicon-Vidicon-Type Camera Tubes (1974)
  • Shiraki Hiromitsu ID: 9000252938190

    Central Research Laboratories, Nippon Electric Co., Ltd. (1971 from CiNii)

    Articles in CiNii:1

    • Bright Spots in the Image of Silicon Vidicon (1971)
  • Shiraki Hiromitsu ID: 9000252940514

    Central Research Laboratories, Nippon Electric Company (1974 from CiNii)

    Articles in CiNii:1

    • Silicon Wafer Annealing Effect in Loop Defect Generation (1974)
  • Shiraki Hiromitsu ID: 9000252941481

    Central Research Laboratories, Nippon Electric Company, Limited (1975 from CiNii)

    Articles in CiNii:1

    • Reduction of Silicon Vidicon Dark Current by HCl Oxidation (1975)
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