Search Results1-20 of  1142

  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 1000020154768

    IMRAM Tohoku Univ. (2015 from CiNii)

    Articles in CiNii:51

    • Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High - Energy Electron Diffraction (2001)
    • Growth Kinetics of Very Thin Oxide Layers on Si(001) Surface Monitored in Real-time by Auger Electron Spectroscopy Combined with Reflection High Energy Electron Diffraction (2002)
    • In-situ Observation of Oxidation of Ti(0001) Surface by Real-time Photoelectron Spectroscopy Using Synchrotron Radiation (2003)
  • Takakuwa Y. ID: 9000322091431

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan (2019 from CiNii)

    Articles in CiNii:20

    • 16aCB-12 BRAES Profiles from ZnO(0001) Surface Excited by RHEED (2015)
    • Real-time photoelectron spectroscopy study of the phase transition of Si(111) oxidation at high temperature (2012)
    • Changes of the oxidation states on Si(111) after ceasing O2 gas supply observed by real-time photoelectron spectroscopy (2012)
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