Search Results1-20 of  74

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  • Takatsuji Toshiyuki ID: 9000007532047

    Articles in CiNii:1

    • Simultaneous Measurement of Three Orthogonal Components of Displacement by Electronic Speckle-pattern Interferometry and the Fourier Transform Method (1997)
  • Takatsuji Toshiyuki ID: 9000007532160

    Articles in CiNii:1

    • A simple instrument for measuring edge angles using a light sectioning method (1998)
  • Takatsuji Toshiyuki ID: 9000007532232

    Articles in CiNii:1

    • Restriction on the arrangement of laser trackers in laser trilateration (1999)
  • Takatsuji Toshiyuki ID: 9000007533324

    Articles in CiNii:1

    • A Procedure for Scaling Sensory Attributes Based on Multidimensional Measurements:Application to Sensory Sharpness of Kitchen Knives (1996)
  • Takatsuji Toshiyuki ID: 9000007533358

    Articles in CiNii:1

    • The first measurement of a three-dimensional coordinate by use of a laser tracking interferometer system based on trilateration (1998)
  • Takatsuji Toshiyuki ID: 9000007533566

    Articles in CiNii:1

    • Whole-viewing-angle cat's-eye retroreflector as a target of laser trackers (2000)
  • Takatsuji Toshiyuki ID: 9000007533602

    Articles in CiNii:1

    • Technical Report Initial performance check of NRLM's CMM using NML's 300mm ball-plate (2000)
  • Takatsuji Toshiyuki ID: 9000007533652

    Articles in CiNii:1

    • The relationship between the measurement error and the arrangement of laser trackers in laser trilateration (2000)
  • Takatsuji Toshiyuki ID: 9000007533682

    Articles in CiNii:1

    • Joint experiments on the calibration of the ball-plate by Poland and Japan (2000)
  • TAKATSUJI TOSHIYUKI ID: 9000258701473

    Articles in CiNii:1

    • A Traceable thickness determination by using X-ray reflectometry (2006)
  • TAKATSUJI Toshiyuki ID: 9000001387047

    National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST) (2009 from CiNii)

    Articles in CiNii:3

    • 非接触三次元計測の標準化 : 国内外の動向 (2005)
    • ダブルボールアーティファクトによる歯形測定機の検査・校正 (2006)
    • Length and Dimensional Standards (2009)
  • TAKATSUJI Toshiyuki ID: 9000001932179

    National Research Laboratory of Metrology, AIST (1997 from CiNii)

    Articles in CiNii:1

    • Simultaneous Measurement of Three Components of Displacement using Laser Interferometry (1997)
  • TAKATSUJI Toshiyuki ID: 9000001996991

    (独)産業技術総合研究所計測標準研究部門 (2009 from CiNii)

    Articles in CiNii:2

    • X-ray Reflectometry with SI Traceability for Thickness Evaluation : Reduction of Uncertainty Caused by Surface Flatness of Specimens (2007)
    • Metrological Standard and its Dissemination System in Japan : Length (2009)
  • TAKATSUJI Toshiyuki ID: 9000002961559

    National Institute of Advanced Industrial Science and Technology (2013 from CiNii)

    Articles in CiNii:62

    • Accuracy Evaluation of Parallel Mechanism Using Laser Tracking Coordinate Measuring System (1998)
    • 自己キャリブレーションを用いたレーザトラッキングによる三次元座標測定 (1997)
    • 自己キャリブレーション法を使ったレーザ三辺測量における干渉計の配置に関する制限 (1998)
  • TAKATSUJI Toshiyuki ID: 9000002961865

    独立行政法人産業技術総合研究所 (2003 from CiNii)

    Articles in CiNii:3

    • バーチャルCMM(3次元測定機)の国際標準化 (2001)
    • Frontiers of Precision Engineering (2002)
    • Personnel Training in Independent Administrative Institutions (2003)
  • TAKATSUJI Toshiyuki ID: 9000018702131

    AIST (2010 from CiNii)

    Articles in CiNii:1

    • Calibration and uncertainty evaluation of single pitch deviation by multiple-measurement technique (2010)
  • TAKATSUJI Toshiyuki ID: 9000020109344

    産業技術総合研究所 (2004 from CiNii)

    Articles in CiNii:1

    • Traceability System of Coordinate Measuring Machines Through Internet (2004)
  • TAKATSUJI Toshiyuki ID: 9000254770945

    National Research Laboratory, of Metrology (1998 from CiNii)

    Articles in CiNii:1

    • Accuracy Evaluation of Parallel Mechanism Using Laser Tracking Coordinate Measuring System (1998)
  • TAKATSUJI Toshiyuki ID: 9000257983428

    National Metrology Institute of Japan (NMIJ), AIST (2007 from CiNii)

    Articles in CiNii:1

    • X-ray Reflectometry with SI Traceability for Thickness Evaluation-Reduction of Uncertainty Caused by Surface Flatness of Specimens-:—Reduction of Uncertainty Caused by Surface Flatness of Specimens— (2007)
  • TAKATSUJI Toshiyuki ID: 9000258206474

    National Metrology Institute of Japan, AIST (2009 from CiNii)

    Articles in CiNii:1

    • High accuracy three-dimensional shape measurements for supporting manufacturing industries (2009)
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