Search Results1-20 of  28

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  • TAMBO Toyokazu ID: 9000001436820

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University (2005 from CiNii)

    Articles in CiNii:1

    • Growth Temperature Dependence of SrTiO_3 Thin Films by Molecular Beam Epitaxy (2005)
  • TAMBO Toyokazu ID: 9000003305610

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University (2005 from CiNii)

    Articles in CiNii:8

    • Structural Transformations During Sb Adsorption on Si(111)-In(4x1) Reconstruction (2001)
    • Structural Characterization of Si_<0.75>Ge_<0.25> Alloy Layers with Sb/Ge-Mediated Low Temperature-grown Si Buffers (2005)
    • XPS Study on the Chemical Shifts of Crystalline 3-6 Layered Compounds (1985)
  • TAMBO Toyokazu ID: 9000005891185

    Faculty of Engineering, Toyama University (2000 from CiNii)

    Articles in CiNii:1

    • Effect of In(4 x 1) Reconstruction Induced Interface Modification on the Growth Behavior of InSb on Si(111) Substrate (2000)
  • Tambo Toyokazu ID: 9000021869259

    Faculty of Engineering, University of Toyama (2010 from CiNii)

    Articles in CiNii:1

    • Light Sensor System Measuring Declination and Orientation (2010)
  • Tambo Toyokazu ID: 9000252954561

    Department of Electronics, Faculty of Engineering, Toyama University (1984 from CiNii)

    Articles in CiNii:1

    • XPS Study on the Change of Surface Potential of GaSe and InSe Induced by Ar<SUP>+</SUP> Sputtering (1984)
  • Tambo Toyokazu ID: 9000254560704

    Department of Electronics, Faculty of Engineering, Toyama University (1985 from CiNii)

    Articles in CiNii:1

    • XPS Study on the Chemical Shifts of Crystalline III–VI Layered Compounds (1985)
  • Tambo Toyokazu ID: 9000258152487

    Faculty of Engineering, Toyama University, 3190 Gofuku, Toyama 930-8555, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Effect of In(4*1) Reconstruction Induced Interface Modification on the Growth Behavior of InSb on Si(111) Substrate. (2000)
  • Tambo Toyokazu ID: 9000258157380

    Faculty of Engineering, Toyama University, 3190 Gofuku, Toyama 930-8555, Japan (2001 from CiNii)

    Articles in CiNii:1

    • Structural Transformations During Sb Adsorption on Si(111)-In(4*1) Reconstruction. (2001)
  • Tambo Toyokazu ID: 9000258158614

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University, 3190 Gofuku, Toyama 930-8555, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Stability of Two-Step-Growth Bi2Sr2CuOx Films on Si(001) using SrO Buffer Layer. (2002)
  • Tambo Toyokazu ID: 9000258161542

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University, 3190 Gofuku, Toyama 930-8555, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Short-Period (Si14/Ge1)N Superlattice Buffers for Growth of Si0.75Ge0.25 Alloy Layers. (2002)
  • Tambo Toyokazu ID: 9000258170600

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University (2004 from CiNii)

    Articles in CiNii:1

    • Solid-Phase Epitaxial Growth of SrTiO3 Thin Films on Si(001) Substrates at Low Temperature (2004)
  • Tambo Toyokazu ID: 9000258178126

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University (2005 from CiNii)

    Articles in CiNii:1

    • Growth Temperature Dependence of SrTiO3 Thin Films by Molecular Beam Epitaxy (2005)
  • Tambo Toyokazu ID: 9000258181687

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University (2005 from CiNii)

    Articles in CiNii:1

    • Structural Characterization of Si0.75Ge0.25 Alloy Layers with Sb/Ge-Mediated Low Temperature-grown Si Buffers (2005)
  • Tambo Toyokazu ID: 9000283572602

    Department of Electrical and Electronic Engineerting, Faculty of Engineerting, Toyama University, Japan (2005 from CiNii)

    Articles in CiNii:1

    • Adsorption mechanisms of In atoms onto the Si(111)-7* 7; Clustering and substitution for Si atoms (2005)
  • Tambo Toyokazu ID: 9000392690542

    Articles in CiNii:1

    • XPS Study on the Change of Surface Potential of GaSe and InSe Induced by Ar<SUP>+</SUP> Sputtering (1984)
  • Tambo Toyokazu ID: 9000401595051

    Articles in CiNii:1

    • XPS Study on the Change of Surface Potential of GaSe and InSe Induced by Ar+Sputtering (1984)
  • Tambo Toyokazu ID: 9000401673686

    Articles in CiNii:1

    • Molecular Beam Epitaxy of SrTiO3Films on Si(100)-2×1 with SrO Buffer Layer (1998)
  • Tambo Toyokazu ID: 9000401676889

    Articles in CiNii:1

    • In(4× 3) Reconstruction Mediated Heteroepitaxial Growth of InSb on Si(001) Substrate (1998)
  • Tambo Toyokazu ID: 9000401690147

    Articles in CiNii:1

    • Effect of In(4×1) Reconstruction Induced Interface Modification on the Growth Behavior of InSb on Si(111) Substrate (2000)
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