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  • TAMURA Eiichi ID: 9000003715158

    Kobe Steel Ltd. (2015 from CiNii)

    Articles in CiNii:29

    • Improvement of Fatigue Strength of High Tensile Strength Steel Sheet with a Pierced Hole by Coining (Second Report) : FEM Analysis for Introduction of Residual Stress by Coining (2004)
    • Improvement of Fatigue Strength of High Tensile Strength Steel Sheet with a Pierced Hole by Coining (Third Report) : A Study on the Mechanism for Introduction of Compressive Residual Stress (2004)
    • Loading Frequency Dependence of High Temperature Fatigue Crack Growth in the Near-Threshold Region and Discussions on Characteristics of Crack Growth Resistance (1997)
  • TAMURA Eiichi ID: 9000003809111

    Department of Mechanical Engineering and Systems, Graduate School of Engineering, Osaka University (2001 from CiNii)

    Articles in CiNii:3

    • SA-07-2(099) Loading Frequency Effect on Near-Threshold and Sub-Threshold Fatigue Crack Growth in SUS304 Steel at an Elevated Temperature(Flaw Assessment at Elevated Temperature 2) : (2001)
    • Near-Threshold Fatigue Crack Growth Behavior of SUS304 Steel at High Temperatures Using Interferometric Strain/Displacement Gage (1st Report, Crack Closure Behavior) (1999)
    • Near-Threshold Fatigue Crack Growth Behavior of SUS304 Steel at High Temperatures Using Interferometric Strain/Displacement Gage(2nd Report, Fatigue Crack Growth Behavior) (1999)
  • TAMURA Eiichi ID: 9000020341685

    早稲田大学理工学部物理教室 (1978 from CiNii)

    Articles in CiNii:1

    • The Diffusion of Laue Spots in Electron Diffraction (1978)
  • TAMURA Eiichi ID: 9000254141368

    Articles in CiNii:1

    • Near-Threshold Fatigue Crack Growth Behavior of SUS304 Steel at High Temperatures Using Interferometric Strain/Displacement Gage. 2nd Report, Fatigue Crack Growth Behavior. (1999)
  • TAMURA Eiichi ID: 9000254141378

    Articles in CiNii:1

    • Near-Threshold Fatigue Crack Growth Behavior of SUS304 Steel at High Temperatures Using Interferometric Strain/Displacement Gage. 1st Report, Crack Closure Behavior. (1999)
  • Tamura Eiichi ID: 9000256111691

    Articles in CiNii:1

    • TMR Effect and Resonant Tunneling in Magnetic Tunnel Junctions. (2003)
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