Search Results1-9 of  9

  • TAMURA Yasuyuki ID: 9000002169396

    Semiconductor Leading Edge Technologies (Selete), AIST (2005 from CiNii)

    Articles in CiNii:1

    • Importance of Leakage Current Noise Analysis for Accurate Lifetime Prediction of High-k Gate Dielectrics (2005)
  • TAMURA Yasuyuki ID: 9000004918588

    Fujitsu Laboratories Ltd. (2002 from CiNii)

    Articles in CiNii:4

    • High Quality Ultra-Thin Gate Oxide using UV/O_3 Surface Pre-Treatment of Native Oxide (1995)
    • High Performance & Highly reliable Deep Submicron CMOS-FETs using Nitrided-Oxide (1999)
    • Improvement of Hot Carrier Immunity in 0.18 μm CMOS with NO-Anneated Sidewall (1998)
  • TAMURA Yasuyuki ID: 9000004970077

    Semiconductor Leading Edge Technologies, Inc. (Selete) (2005 from CiNii)

    Articles in CiNii:3

    • Integration of HfSiON Transistors for Low-Standby-Power Applications (2005)
    • 65nm-node CMOS Process for Low Power Devices : LOP Specific Ultra-Shallow Junction Technology, and LSTP Specific HfSiON Transistor Technology (2004)
    • 65nm-node CMOS Process for Low Power Devices : LOP Specific Ultra-Shallow Junction Technology, and LSTP Specific HfSiON Transistor Technology (2004)
  • TAMURA Yasuyuki ID: 9000006490440

    Articles in CiNii:5

    • Single crutch gait with orthosis of an old patient with thigh amputation and respiratory dysfunction. (2000)
    • Total Arthroplasty for Rheumatoid Ankylosed Elbow : A Report of Two Cases (2005)
    • The follow-up study of Kyocera type 1 total elbow arthroplasty in patients with rheumatoid arthritis (2008)
  • TAMURA Yasuyuki ID: 9000283251408

    CANON INC. BJ Product Design Center (1998 from CiNii)

    Articles in CiNii:1

    • Dot Formation Mechanism in lnk Jet Printing (1998)
  • Tamura Yasuyuki ID: 9000258151972

    ULSI Technology Laboratory, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Impact of Nitrogen Profile in Gate Oxynitride on Complementary Metal Oxide Semiconductor Characteristics. (2000)
  • Tamura Yasuyuki ID: 9000258650165

    IDEC TOSOK (2009 from CiNii)

    Articles in CiNii:1

    • Ultra-precise positioning over a one-Millimeter stroke using differential ball screw:Positioning accuracy of coaxial overlapped differential ball screw driven by step motor (2009)
  • Tamura Yasuyuki ID: 9000283815579

    NIDEC TOSOK Co. (2008 from CiNii)

    Articles in CiNii:1

    • Ultra-precise positioning over a One-Millimeter Stroke Using Differential Ball Screw:Coaxial overlapped differential ball screw (2008)
  • Tamura Yasuyuki ID: 9000401688370

    Articles in CiNii:1

    • Impact of Nitrogen Profile in Gate Oxynitride on Complementary Metal Oxide Semiconductor Characteristics (2000)
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