Search Results1-20 of  38

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  • TAMURA Shigeo ID: 9000004960588

    Research Center for Quantum Effect Electronics, Tokyo Institute of Technology:JST-CREST Kawaguchi Center Building (2003 from CiNii)

    Articles in CiNii:19

    • Estimation of Sidewall Nonradiative Recombination in GaInAsP/InP Wire Structures Fabricated by Low Energy Electron-Cyclotron-Resonance Reactive-Ion-Beam-Etching (1998)
    • GaInAsP/InP Multiple-Layered Quantum-Wire Lasers Fabricated by CH_4/H_2-Reactive-Ion-Etching (1999)
    • GaInAsP/InP Long Wavelength Quantum-Wire Lasers (2003)
  • TANUMA Shigeo ID: 9000004507745

    Articles in CiNii:56

    • XPS Study of a Sodium Alkane Sulfonate Anti-static Agent in a Polypropylene Sheet (1995)
    • Auger Depth Profiling Analyses of InP/GaInAsP Multilayers (1996)
    • An Evaluation of the Multilayer Structures of Compound Semi-conductors Using Ion Sputtering Method (1999)
  • TANUMA Shigeo ID: 9000004507893

    Articles in CiNii:3

    • ピークシフトを考慮した非負拘束付き最小二乗法によるピーク分離 (1993)
    • AES Depth-profileデータ処理方法の検討--ファクターアナリシスと非負拘束付最小二乗法の比較 (1999)
    • Quantitative analysis of cobalt-nickel alloys by low-energy Auger electron spectroscopy. (1992)
  • TANUMA Shigeo ID: 9000016410343

    Department of Materials Infrastructures National Institute for Materials Science (2010 from CiNii)

    Articles in CiNii:4

    • Advances in Surface Chemical Analysis : From Fundamentals to Standardization (2009)
    • Advances in Surface Chemical Analysis : From Fundamentals to Standardization (2010)
    • Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy-Loss Spectroscopy and Elastic Peak Electron Spectroscopy (2010)
  • TANUMA Shigeo ID: 9000020099996

    Central Research Laboaratories, Nippon Mining Co. Ltd. (1990 from CiNii)

    Articles in CiNii:1

    • Dependence of electron inelastic mean free paths on electron energy and materials at low energy region. I: Elements.:I : Elements (1990)
  • TANUMA Shigeo ID: 9000020638842

    Articles in CiNii:1

    • Quantitative electron microprobe analysis of thin alloy films on substrates based on Gaussian ionization Distribution models. (1991)
  • TANUMA Shigeo ID: 9000020657483

    Articles in CiNii:1

    • Determination of oxygen in double oxides of lanthanoid and niobium by electron probe X-ray microanalyzer (1980)
  • TANUMA Shigeo ID: 9000020672511

    Articles in CiNii:1

    • Dependence of depth resolution on sputtering ion species and energy in Auger sputter depth profiling analysis of gallium arsenide/aluminium arsenide films. (1990)
  • TANUMA Shigeo ID: 9000020679103

    Articles in CiNii:1

    • Complete analysis of hydrous minerals by inductively coupled plasma emission spectroscopy and electron probe X-ray microanalysis (1982)
  • TANUMA Shigeo ID: 9000020745675

    Articles in CiNii:1

    • Calculationsof the electron inelastic free paths in Au-Cu and Au-Ag alloys. (1991)
  • TANUMA Shigeo ID: 9000020745682

    Articles in CiNii:1

    • Quantitative Auger analysis of Au-Cu alloys using low-energy Auger peaks. (1991)
  • TANUMA Shigeo ID: 9000252915804

    Japan Energy Analytical Research Center Co., Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • An Evaluation of the Multilayer Structures of Compound Semi-conductors Using Ion Sputtering Method. (1999)
  • TANUMA Shigeo ID: 9000253648029

    Research and Development Group, Nippon Mining Co., Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • Auger Depth Profile Analysis of GaAs/AlAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting. (1992)
  • TANUMA Shigeo ID: 9000253648036

    Research and Development Group, Nippon Mining Co., Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam. (1992)
  • TANUMA Shigeo ID: 9000253648177

    Research and Development Group (1992 from CiNii)

    Articles in CiNii:1

    • Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Effects of Zalar Rotation and Liquid Nitrogen Cold Stage. (1992)
  • TANUMA Shigeo ID: 9000253648410

    Central Research Laboratory, Japan Energy Corporation (1994 from CiNii)

    Articles in CiNii:1

    • Electron Inelastic Mean Free Paths in Organic Materials Especially for Polyethylene and Guanine.:Especially for Polyethylene and Guanine (1994)
  • TANUMA Shigeo ID: 9000253648760

    Japan Energy Analytical Research Center Co., Ltd. (1996 from CiNii)

    Articles in CiNii:1

    • Auger Depth Profiling Analyses of InP/GaInAsP Multilayers. (1996)
  • TANUMA Shigeo ID: 9000253648821

    Japan Energy Analytical Research Center Co., LTD. (1996 from CiNii)

    Articles in CiNii:1

    • Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy:Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering (1996)
  • TANUMA Shigeo ID: 9000254934148

    JAPAN ENERGY ANALYTICAL RESEARCH CENTER CORPORATION (1995 from CiNii)

    Articles in CiNii:1

    • XPS Study of a Sodium Alkane Sulfonate Anti-static Agent in a Polypropylene Sheet. (1995)
  • TANUMA Shigeo ID: 9000257982460

    Materials Engineering Laboratory, National Institute for Materials Science (2002 from CiNii)

    Articles in CiNii:1

    • PSA-01 (Practical Surface Analysis 2001) (2002)
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