Search Results1-19 of  19

  • TODA Fumihiko ID: 9000000033417

    Dept. of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University (1999 from CiNii)

    Articles in CiNii:2

    • BaRbBiO Thin Films Prepared with Radio Frequency Magnetron Sputtering (1998)
    • The Preparation of Ba_<1-x>Rb_xBiO_y Sputtering Films (1999)
  • TODA Fumihiko ID: 9000004763202

    Articles in CiNii:7

    • Superconducting base transistor. (1994)
    • 有機金属気相成長YBa2Cu3O7薄膜を用いたバイクリスタル粒界接合素子 (先端技術特集) (1998)
    • 高エネルギー電子注入型酸化物超電導ベース3端子素子技術 (特集 超電導特集) -- (超電導素子化技術開発) (1999)
  • TODA Fumihiko ID: 9000004871781

    Research Laboratory, Oki Electric Industry Co., Ltd. (1997 from CiNii)

    Articles in CiNii:3

    • Electrical Properties of Al/Al_2O_3/(Ba,Rb)BiO_3/SrTiO_3(Nb) Three Terminal Device (1996)
    • Formation of (Ba, Rb)BiO_3 Thin Films by Molecular Beam Epitaxy Using Distilled Ozone (Special Issue on High-Temperature Superconducting Electronics) (1993)
    • Electrical Properties of Al/Al_2O_3/(Ba, Rb)BiO_3/SrTiO_3(Nb)Three Terminal Device (1997)
  • TODA Fumihiko ID: 9000006838476

    Corporate Research and Development Center, Oki Electric Industry Co., Ltd. (2009 from CiNii)

    Articles in CiNii:4

    • Effects of a Thermal CVD SiN Passivation Film on AlGaN/GaN HEMTs (2008)
    • Comparisons of SiN Passivation Film Deposited by PE-CVD and T-CVD Method for AlGaN/GaN HEMTs on SiC Substrate (2009)
    • AlGaN/GaN-HEMTs on SiC with SiN Passivation Film Grown by Thermal CVD (2008)
  • TODA Fumihiko ID: 9000014434653

    OKI Electric Industry (2009 from CiNii)

    Articles in CiNii:16

    • Fabrication of low ohmic contacts using selective area growth with MOCVD (2006)
    • Recessed gate structure MIS-AlGaN/GaN-HEMT with SiN gate insulator deposited by Thermal CVD (2009)
    • Stress Effects of Passivation Film on AlGaN/GaN-HEMT Characteristics (2004)
  • TODA Fumihiko ID: 9000020098891

    Dept. of Electrical and Electronic Engineering, Faculty of Engineering, Tottori Univ. (1990 from CiNii)

    Articles in CiNii:1

    • XPS measurements of 7K-phase Bi-Sr-Ca-Cu-O superconducting single crystals. (1990)
  • TODA Fumihiko ID: 9000107341982

    Corporate Research and Development Center, Oki Electric Industry Co., Ltd. (2009 from CiNii)

    Articles in CiNii:1

    • 12.88W/mm GaN High Electron Mobility Transistor on Silicon Substrate for High Voltage Operation (2009)
  • TODA Fumihiko ID: 9000107374335

    Oki Electric Industry Co., Ltd. (1998 from CiNii)

    Articles in CiNii:1

    • X-Ray Photoelectron Spectroscopy Study of Junction Interface in In/BaRbBiO Films (1998)
  • TODA Fumihiko ID: 9000252845507

    R & D Group Oki Electric Co. Ltd. (1994 from CiNii)

    Articles in CiNii:1

    • Superconducting base transistor (1994)
  • Toda Fumihiko ID: 9000252974545

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University (1990 from CiNii)

    Articles in CiNii:1

    • XPS Studies of 80 K-Phase Bi–Sr–Ca–Cu–O Single Crystals (1990)
  • Toda Fumihiko ID: 9000258136250

    Research Laboratory, Oki Electric Industry Co., Ltd., 550–5 Higashiasakawa–cho, Hachiohji–shi, Tokyo 193, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Electrical Properties of Al/Al2O3/(Ba, Rb)BiO3/SrTiO3(Nb) Three Terminal Device. (1997)
  • Toda Fumihiko ID: 9000258141946

    Oki Electric Industry Co., Ltd., 550–5, Higashiasakawa–cho, Hachioji, Tokyo 193, Japan (1998 from CiNii)

    Articles in CiNii:1

    • X-Ray Photoelectron Spectroscopy Study of Junction Interface in In/BaRbBiO Films. (1998)
  • Toda Fumihiko ID: 9000283158524

    Articles in CiNii:1

    • In/(Ba, Rb)BiO3/SrTiO3(Nb) Three-Terminal Device. (1994)
  • Toda Fumihiko ID: 9000392718380

    Articles in CiNii:1

    • XPS Studies of 80 K-Phase Bi–Sr–Ca–Cu–O Single Crystals (1990)
  • Toda Fumihiko ID: 9000401566355

    Articles in CiNii:1

    • 12.88 W/mm GaN High Electron Mobility Transistor on Silicon Substrate for High Voltage Operation (2009)
  • Toda Fumihiko ID: 9000401620452

    Articles in CiNii:1

    • XPS Studies of 80 K-Phase Bi-Sr-Ca-Cu-O Single Crystals (1990)
  • Toda Fumihiko ID: 9000401646662

    Articles in CiNii:1

    • $\bf In/(Ba,\,Rb)BiO_{3}/SrTiO_{3}(Nb)$ Three-Terminal Device (1994)
  • Toda Fumihiko ID: 9000401663176

    Articles in CiNii:1

    • Electrical Properties ofAl/Al2O3/(Ba,Rb)BiO3/SrTiO3(Nb) Three Terminal Device (1997)
  • Toda Fumihiko ID: 9000401671924

    Articles in CiNii:1

    • X-Ray Photoelectron Spectroscopy Study of Junction Interface in In/BaRbBiO Films (1998)
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