Search Results1-20 of  130

  • TOKUMOTO Hiroshi ID: 9000000616113

    Graduate School of Science and Technology, Chuo University, Chuo University (2010 from CiNii)

    Articles in CiNii:3

    • ナノテクノロジー研究分野の一側面 - IUVSTAのNanometer Structures 分野 STD 委員就任に当って - (2001)
    • 第15回真空国際会議・第48回米国真空協会会議・第11回固体表面国際会議 (IVC-15/AVS-48/ICSS-11) (2002)
    • General View of Graphenes (2010)
  • TOKUMOTO Hiroshi ID: 9000004672179

    Department of Internal Medicine, Hyogo Prefectural Amagasaki Hospital (1996 from CiNii)

    Articles in CiNii:4

    • Primary Pulmonary Hemangiopericytoma Detected on Routine Chest X-ray Examination (1996)
    • 66.肺原発と考えられた悪性黒色腫の1例 (1996)
    • 最近当院で経験した同時多発肺癌症例の検討 : 多発癌と重複癌 (1995)
  • Tokumoto Hiroshi ID: 9000008207522

    Articles in CiNii:1

    • Magnetoacoustic Resonance Study of Acceptor Ground-State in Germanium (1976)
  • TOKUMOTO HIROSHI ID: 9000253032212

    National Institute for Advanced Interdisciplinary Research (1995 from CiNii)

    Articles in CiNii:1

    • Prospects of scanning probe microscopy for nanometer-scale lithography. (1995)
  • TOKUMOTO Hiroshi ID: 9000003274807

    Electrotechnical Laboratory (1974 from CiNii)

    Articles in CiNii:1

    • Frequency Dependence of Acoustic Absorption by Acceptor Holes in Si (1974)
  • TOKUMOTO Hiroshi ID: 9000003276457

    Joint Research Center for Atom Technology (JRCAT) (2002 from CiNii)

    Articles in CiNii:32

    • Surface Observation and Modification of Si Substrate in NH_4F and H_2SO_4 Solutions (1996)
    • Investigation of the Peptide Conformation by Measuring Force Curve using AFM (2002)
    • Monolayer Nitridation of Si(001) Surfaces (2001)
  • TOKUMOTO Hiroshi ID: 9000004744383

    Research Institute for Electronic Science, Hokkaido University (2003 from CiNii)

    Articles in CiNii:2

    • Flux Penetration into a Narrow Strip of High-Tc Superconducting Film and the Flux Noise of a SQUID (2003)
    • Flux Penetration into a Narrow Strip of High-Tc Superconducting Film and the Flux Noise of a SQUID (2003)
  • TOKUMOTO Hiroshi ID: 9000005753792

    Electrotechincal Laboratory (1982 from CiNii)

    Articles in CiNii:1

    • Application of Photoacoustic Spectroscopy to Solids (1982)
  • TOKUMOTO Hiroshi ID: 9000005753832

    Electrotechnical Laboratory (1983 from CiNii)

    Articles in CiNii:2

    • Brillouin Scattering in BiVO_4 at High Temperatures : Physical Acoustics (1982)
    • Brillouin Scattering from Quartz : Physical Acoustics (1983)
  • TOKUMOTO Hiroshi ID: 9000005754259

    Electrotechnical Laboratory:Department of Physics, Bedford College (1983 from CiNii)

    Articles in CiNii:1

    • Ultrasonic Attenuation in the Magnetic Freeze-Out and Carrier Hopping Regions of n-InSb : Physical Acoustics (1983)
  • TOKUMOTO Hiroshi ID: 9000005754263

    Electrotechnical Laboratory (1983 from CiNii)

    Articles in CiNii:1

    • Photoacoustic Study of Chromium State in GaAs : Physical Acoustics (1983)
  • TOKUMOTO Hiroshi ID: 9000020689899

    Articles in CiNii:1

    • Scanning tunneling microscopy of semiconductor surfaces. (1987)
  • TOKUMOTO Hiroshi ID: 9000020759024

    Articles in CiNii:1

    • Development of an Ultrahigh Vacuum Scanning Tunneling Microscope with a Field Ion Microscope and Observation of the Initial Stage of Al Adsorption on Si(001). (1994)
  • TOKUMOTO Hiroshi ID: 9000020778526

    Articles in CiNii:1

    • Analysis of a Chemical Vapor Deposition Process with Tetraethyl Orthosilicate and Ozone Using an Atomic Force Microscope. (1994)
  • TOKUMOTO Hiroshi ID: 9000020795258

    Electrotechnical Laboratory (1987 from CiNii)

    Articles in CiNii:1

    • Scanning tunneling spectroscopy. (1987)
  • TOKUMOTO Hiroshi ID: 9000021225822

    Electrotechnical Laboratory (1992 from CiNii)

    Articles in CiNii:1

    • Special Issues/In Situ Surface Analytical Techniques and Their Applications to Surface Finishing Technology. STM/AFM in Semiconductor Technology. (1992)
  • TOKUMOTO Hiroshi ID: 9000252845300

    Electrotechnical Laboratory (1991 from CiNii)

    Articles in CiNii:1

    • Scanning probe microscope (STM and AFM) (1991)
  • TOKUMOTO Hiroshi ID: 9000252915733

    Joint Research Center for Atom Technology (JRCAT) (1996 from CiNii)

    Articles in CiNii:1

    • Passivation Technologies for Semiconductors. Structure of Hydrogen-Passivated Si Surfaces Studied by STM. (1996)
  • TOKUMOTO Hiroshi ID: 9000253322174

    電子技術総合研究所基礎部 (1981 from CiNii)

    Articles in CiNii:1

    • Photoacoustic Signals of Semiconductors by Microphone Detection (1981)
  • TOKUMOTO Hiroshi ID: 9000253324078

    Electrotechnical Laboratory. (1987 from CiNii)

    Articles in CiNii:1

    • Scanning Tunneling Microscopy (1987)
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